A novel harmonic balance surrogate-based technique to create fast and accurate behavioral models predicting, in the early design stage, the performance of nonlinear analog devices during immunity tests is presented. The obtained immunity model hides the real netlist, reduces the simulation time, and avoids expensive and time-consuming measurements after tape-out, while still providing high accuracy. The model can easily be integrated into a circuit simulator together with additional subcircuits, e.g., board and package models, as such allowing to efficiently reproduce complete immunity test setups during the early design stage and without disclosing any intellectual property. The novel method is validated by means of application to an industrial case study, being an automotive voltage regulator, clearly showing the technique's capabilities and practical advantages.
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