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Characterization of SOI photonic crystal tapers by scanning near-field optical microscopy (SNOM)(abstract)

机译：通过扫描近场光学显微镜（sNOm）表征sOI光子晶体锥形（摘要）

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NEEL D; BENYATTOU T; SANCHIZ P; MARTI J; Bogaerts Wim; Dumon Pieter; Baets Roel;
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年度 2006
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Characterization of SOI photonic crystal tapers by scanning near-field optical microscopy (SNOM)(abstract)

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