A simple method to identify significant effects in unreplicated two-level factorial designs

摘要

This article proposes a generalization and improvement on the method of Lenth (1989). The problem is solved by fixing outliers in highly contaminated samples. To do this a scale robust estimator is obtained and its performance is analyzed using computer simulations. The method is extremely simple to use and leads to the same results as the more complex one proposed by Box and Meyer (1986).