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Nanoscale stability of two- and three-dimensional defects in Cu/Ag–Mo thin films

机译：Cu / ag-mo薄膜中二维和三维缺陷的纳米级稳定性

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Csiszár G.; Makvandi A.; Mittemeijer E.;
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Nanoscale stability of two- and three-dimensional defects in Cu/Ag–Mo thin films

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