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Nonlinear characterization of materials using the D4σ method inside a Z-scan 4f-system

机译:在Z扫描4f系统内使用D4σ方法对材料进行非线性表征

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摘要

We show that direct measurement of the beam radius in Z-scan experiments using a CCD camera at the output of a 4f -imaging system allows higher sensitivity and better accuracy than Baryscan. One of the advantages is to be insensitive to pointing instability of pulsed lasers because no hard (physical) aperture is employed as in the usual Z-scan. In addition, the numerical calculations involved here and the measurement of the beam radius are simplified since we do not measure the transmittance through an aperture and it is not subject to mathematical artifacts related to a normalization process, especially when the diffracted light intensity is very low.
机译:我们表明,在4f成像系统的输出端使用CCD相机在Z扫描实验中直接测量光束半径,可以实现比Baryscan更高的灵敏度和更好的精度。优点之一是对脉冲激光的指向不稳定不敏感,因为不像通常的Z扫描那样使用硬(物理)孔径。另外,这里涉及的数值计算和光束半径的测量被简化了,因为我们没有测量通过孔径的透射率,并且它不受与归一化过程有关的数学伪像的影响,尤其是当衍射光强度非常低时。

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