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On a Method to Employ Newton's Rings Concept to Determine Thickness of Thin Films

机译:用牛顿环概念确定薄膜厚度的方法

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摘要

Newton’s Rings experiment is traditionally utilized to find radius curvature of a lens. We propose a method in which this same set up can be used to find the thickness of thin films. The working principle is interference. It is based on the fact that, the formation of bright and dark interference fringes is a measure of the thickness of the air film at that point. We present the experimental data. The results from the experiment are in agreement with results obtained through geometry. Further, a method to improvise conventional interference at air wedge experiment which is generally used to determine the thickness of thin films is suggested
机译:传统上是利用牛顿环实验来发现镜片的曲率半径。我们提出了一种方法,其中相同的设置可用于查找薄膜的厚度。工作原理是干扰。基于这样的事实,明暗干涉条纹的形成是在该点处气膜厚度的量度。我们提供实验数据。实验结果与通过几何获得的结果一致。此外,提出了一种在空气楔形实验中改善常规干涉的方法,该方法通常用于确定薄膜的厚度

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