首页> 外文OA文献 >Mathematical analysis of ESD generated EM radiated fields on electronic subsystem
【2h】

Mathematical analysis of ESD generated EM radiated fields on electronic subsystem

机译:电子子系统上EsD产生的Em辐射场的数学分析

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

Electrostatic Discharge (ESD) generated Electromagnetic (EM) radiated fields can cause malfunctioning or upsets in an electronic system. This paper presents a mathematical computation of the effects of spatial electric fields from an ESD source. These fields may affect the normal functioning of an electronic system. This work uses a MATLAB program to model the response of Very High Frequency (VHF) amplifier to ESD generated radiated EM fields. The ESD source is a Capacitive Spark Discharge (CSD) source. The transient current element has been modeled as a short dipole. The electric field intensity and the magnetic field intensity have been computed by varying distance along the θ = π/2 direction for the CSD current. The frequency spectra of these E and H fields are obtained by taking Discrete Fourier Transform (DFT). The open circuit voltage induced by ESD generated transient fields at the antenna terminals and the voltage coupled to the input of the VHF amplifier fed by antenna is computed by varying distances. The time domain representation of the real part of the voltage at the output terminals of the VHF amplifier is computed by varying distance from the ESD source. Mathematical computation is carried out to predict the effect of the radiated fields on the induced voltages of a subsystem for various distances from the ESD source.
机译:产生的静电(ESD)电磁(EM)辐射场可能会导致电子系统故障或故障。本文介绍了来自ESD源的空间电场影响的数学计算。这些字段可能会影响电子系统的正常运行。这项工作使用MATLAB程序对甚高频(VHF)放大器对ESD产生的辐射EM场的响应进行建模。 ESD源是电容火花放电(CSD)源。瞬态电流元件已被建模为短偶极子。通过改变CSD电流沿θ=π/ 2方向的距离,可以计算出电场强度和磁场强度。这些E和H场的频谱是通过离散傅立叶变换(DFT)获得的。通过改变距离来计算由ESD产生的在天线端子处的瞬态场感应的开路电压以及耦合到天线馈给的VHF放大器输入的电压。通过改变与ESD源的距离来计算VHF放大器输出端子上电压的实部的时域表示。进行数学计算以预测在距ESD源各种距离的情况下,辐射场对子系统感应电压的影响。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号