首页> 外文OA文献 >Vapor pressure development in a FR4-CU composite structure during solder reflow
【2h】

Vapor pressure development in a FR4-CU composite structure during solder reflow

机译:回流焊过程中FR4-CU复合结构中的蒸气压升高

摘要

This article presents a study on the development of vapor pressure a FR4-Cu composite structure when heated to a solder reflow temperature of 215 °C. Abaqus® finite element software was used to develop a representative two-dimensional model of the composite structure and to simulate moisture absorption and desorption processes. Simulation of transient moisture absorption was performed to predict moisture concentration distribution in the structure after being preconditioned in 85°C/85 % RH environment for 15 days. Simulation of transient moisture desorption was carried out at the solder reflow temperature to predict the redistribution of the moisture. Results of the moisture desorption simulation were used to compute magnitude of the vapor pressure in the structure. It was found that the moisture redistributes itself during the solder reflow process. Moisture concentration in the vicinity of the FR4-Cu interface, below the longer copper trace increases during the solder reflow. The vapor pressure in nearly 70 % of the FR4 material and close to the FR4-Cu interface, below the longer copper trace is almost equal to the saturation pressure of vapor at 215 °C. Distribution of the vapor pressure is very similar to the new distribution of moisture concentration resulting from moisture desorption process.
机译:本文介绍了当加热到215°C的焊料回流温度时FR4-Cu复合结构的蒸气压发展情况的研究。 Abaqus®有限元软件用于开发复合结构的代表性二维模型,并模拟水分吸收和解吸过程。在85°C / 85%RH环境中预处理15天后,进行了瞬态吸湿模拟,以预测结构中的水分浓度分布。在焊料回流温度下进行了瞬时水分解吸的模拟,以预测水分的重新分布。水分解吸模拟的结果用于计算结构中蒸气压的大小。发现在焊料回流过程中水分会重新分布。在回流焊期间,FR4-Cu界面附近,较长的铜迹线以下的水分浓度会增加。 FR4材料中接近70%且靠近FR4-Cu界面(在较长的铜迹线以下)的蒸气压几乎等于215°C时蒸气的饱和压力。蒸气压的分布与水分解吸过程中产生的水分浓度的新分布非常相似。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号