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Numerical studies of ion beam in NX2 plasma focus for different applied voltage

机译:不同施加电压下NX2等离子体聚焦中离子束的数值研究

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摘要

Plasma focus device gives simultaneous interaction between magnetic and electric field which results in exhibiting multi-radiation properties. Ion beam radiates from the system is significant for experimenting target material of interest in plasma focus research. Lee code model is used to simulate the numerical experiments on NX2-plasma focus device system using different applied voltage in the range 10 to 14 kV. The system is operating in Neon filled at an optimum pressure depending on the applied voltage used in the experiment. Results obtained are analysed and fitted with the experimental results for system validation. Good fitting on the numerical with the experimental results is obtained by incorporating mass shedding effects and current shedding factor. The range of current density obtained is in the range 1.6 × 108 to 7.3×109 Am-2whilst the maximum ion beam energy is estimated to be 156 J.
机译:等离子聚焦装置使磁场和电场同时相互作用,从而表现出多重辐射特性。从系统辐射的离子束对于在等离子体聚焦研究中实验感兴趣的目标材料具有重要意义。使用Lee码模型来模拟在NX2等离子聚焦设备系统上使用10到14 kV不同施加电压的数值实验。该系统在氖气填充下以最佳压力运行,具体取决于实验中使用的施加电压。对获得的结果进行分析,并与实验结果进行拟合,以进行系统验证。通过结合质量脱落效应和电流脱落因子,可以很好地拟合数值与实验结果。获得的电流密度范围在1.6×108至7.3×109 Am-2之间,而最大离子束能量估计为156J。

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