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Optical properties of tin-antimony-selenium based amorphous thin filmsud

机译:锡锑硒基非晶薄膜的光学性质 ud

摘要

Tin-antimony-selenium (TAS) based amorphous belong to the ternary chalcogenide compounds of IV-V-VI group, exhibiting semiconducting properties that could be applied for optical devices in photo-conductive sensor and infrared transmission detectors. The materials were previously studied with emphasize on the structural properties separating the amorphous, a and crystalline regions, c. This paper reports the optical properties of TAS measured using UV spectrophotometer observe the respective absorption spectrum over the visible and near infrared regions and determine the bang gap energies from the plot absorption edges. TAS samples were prepared from granular Sn, Sb and Se of purity 5N using a technique called solid-state reaction. In this method starting materials were thermally evaporated at a pressure of 10-5 mbar onto glass substrate as Sn/Se/Sb/Sn stacked at a substrate temperature of 240 oC. The system employed was a vacuum coater model E306. the spectrum observed from the absorption-wavelenght plots appeared to be a steady decrease in the visible region followed by a sharp drop and a further gradual declining down to near infrared at 2100 nm, with absorption coefficient,  varying from 6.21 x 103 to 1.55 x 105 cm-1 for film thickness between 50 nm to 700 nm, respectively. The corresponding optical band gap,Eg obtained from the graph (h)2 versus h resulted in Eg between 1.47 eV to 1.69 eV which were dependent of film thickness. The value of other optical properties namely refractive indices, extinction coefficient, effective mass and dielectric constant was also being determined and were found to be 2.55-2.85, 0.1x10-2 – 1.1x10-2, 1.42x10-33 kg and 0.006-8.094, respectively. These values varied with the film thickness.ud ud
机译:基于锡锑硒(TAS)的非晶质属于IV-V-VI组的三族硫族化物,具有半导体性能,可用于光电导传感器和红外透射探测器中的光学器件。以前对材料进行过研究,重点是将非晶区,晶体区c和结晶区c分开。本文报道了使用紫外分光光度计测量的TAS的光学性质,观察了可见光和近红外区域的吸收光谱,并从曲线吸收边缘确定了碰撞能。使用称为固态反应的技术,由纯度为5N的颗粒状Sn,Sb和Se制备TAS样品。在这种方法中,将起始材料在10-5 mbar的压力下,以Sn / Se / Sb / Sn的形式在240 oC的基板温度下热蒸发到玻璃基板上。所使用的系统是E306型真空涂布机。从吸收波长图观察到的光谱似乎在可见光区稳定下降,然后急剧下降,并在2100 nm处逐渐下降到近红外,吸收系数ï范围从6.21 x 103至对于50 nm至700 nm之间的膜厚度,分别为1.55 x 105 cm-1。从图(i¡hï®)2相对于hï®获得的相应光学带隙Eg导致Eg在1.47 eV至1.69 eV之间,这与膜厚有关。还确定了其他光学特性的值,即折射率,消光系数,有效质量和介电常数,发现为2.55-2.85、0.1x10-2 – 1.1x10-2、1.42x10-33 kg和0.006 -8.094。这些值随膜厚而变化。 ud ud

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