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A new technicque for metal oxide surge arresters failure diagnostic using return voltage measurement

机译:利用返回电压测量的金属氧化物避雷器故障诊断新技术

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摘要

Due to their reliability and accuracy, many modern diagnostics based on dielectric voltage response, such as polarization/depolarization current (PDC), voltage decay (VD) and return voltage (RV) measurements, have been used in monitoring ageing processes of metal oxide (MO) varistors, which is the main part of a surge arrester. Among these diagnostics, recently, RV measurement (RVM) seems to be an increasingly popular method as it has high sensitivity to the condition of varistors and low sensitivity to disturbances in vicinity of the field measurements. Nonetheless, the basic interpretation based on the RVM essential parameters – peak RV, time-to-peak RV and initial slope of RV - provides insufficient information of the MO varistors condition since they are inevitably dependent on the measuring parameters such as the charging and discharging times as well as the test object temperature. Hence, this project focuses on a new way in interpreting the RVM parameters based on dielectric time constants analysis using an equivalent circuit of varistor microstructure, namely the Maxwell-Model. In order to investigate the ageing processes of MO varistors, two types of accelerated degradation techniques – impulse and heat degradations – are systematically conducted on test samples. Experimental results are presented and discussed in detail according to the underlying physical mechanism. On the basis of this concept, a sensible ageing parameter, p-factor, is used for better characterization of the ageing status of varistors.
机译:由于其可靠性和准确性,许多基于介电电压响应的现代诊断方法(例如极化/去极化电流(PDC),电压衰减(VD)和返回电压(RV)测量)已用于监视金属氧化物的老化过程( MO)压敏电阻,这是电涌放电器的主要部分。在这些诊断中,最近,RV测量(RVM)似乎是一种越来越流行的方法,因为它对压敏电阻的状态具有较高的灵敏度,而对现场测量附近的干扰具有较低的灵敏度。但是,基于RVM基本参数的基本解释-峰值RV,峰峰值RV和RV的初始斜率-提供了MO压敏电阻状况的足够信息,因为它们不可避免地取决于测量参数,例如充电放电时间和测试对象温度。因此,该项目着重于一种新方法,该方法基于介电时间常数分析,使用压敏电阻微结构的等效电路,即麦克斯韦模型,来解释RVM参数。为了研究MO压敏电阻的老化过程,系统地对测试样品进行了两种类型的加速降解技术–脉冲和热降解–。根据潜在的物理机制详细介绍和讨论了实验结果。基于此概念,使用合理的老化参数p因子来更好地表征压敏电阻的老化状态。

著录项

  • 作者

    Abdul Malek Zulkurnain;

  • 作者单位
  • 年度 2009
  • 总页数
  • 原文格式 PDF
  • 正文语种 {"code":"en","name":"English","id":9}
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