Faraday cups are widely utilized to characterize ion and electrons beams. Owing to the secondary electron emission (SEE) induced by the collision of beams with collectors, wrong measurements could emerge from these detectors. To overcome this problem a polarized grid is utilized in front the cup collector at a negative voltage with respect to the collector. Unfortunately, the high voltage connection of the Faraday cups is hard to obtain. Then, in this work we want to study the secondary emission on different Al ion collector designs having tilted surfaces with respect to beam axis. Tests were performed using ion beams accelerated by a power supply up to 40 kV. The results by the modified collector surfaces were compared to the ones performed with a simple flat collector. The results we obtained point out that the secondary electron emission enhanced on incident beam energy and on the angle with respect to the normal direction of the surface. The ratio of the SEE to angle value results constant for the accelerating voltage and the possibility to design an ion collector able to reset the SEE seems not to be reached.
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