In this work we present a study on Faraday cups. These devices are utilized to perform time of flight measurements in order to characterize charged beams in different situations particularly for accelerator by double stage configuration. The secondary electron emission during the beam interaction with ion collector modifies the true current because the read values are strongly dependent on the beam incident angle. To eliminate the suppressing grid, we tested new cup collector surfaces and we compared the results to the ones performed using the flat collector. For this purpose, we performed experiments utilizing simple tilted collectors at 30°, 45° and 55° determining the gamma factor of the secondary electron emission. Tests were performed utilizing Cu ion beams at energy up to 40 kV
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