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A Novel Reseeding Technique for Accumulator-based Test Pattern Generation

机译：一种基于蓄能器的测试模式生成的新技术

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X. Kavousianos; D. Bakalis; D. Nikolos;
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年度 2015
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1. A Built-in Reseeding Technique for LFSR-Based Test Pattern Generation [J] . Youhua SHI, Zhe ZHANG, Shinji KIMURA, IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences . 2003,第12期

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2. Low-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom Test Pattern Generation and Reseeding [J] . Dong Xiang, Xiaoqing Wen, Laung-Terng Wang IEEE transactions on very large scale integration (VLSI) systems . 2017,第3期

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3. Effective LFSR Reseeding Technique for Achieving Reduced Test Pattern [J] . S. Saravanan, Har Narayan Upadhyay Research journal of applied science, engineering and technology . 2012,第22期

机译：有效的LFSR播种技术，以减少测试图样
4. New reseeding technique for LFSR-based test pattern generation [C] . Kalligeros E., Kavousianos X., Bakalis D., International Conference on Next Generation Information Technology . 2011

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7. Techniques for SAT-based constrained test pattern generation [O] . Jiri Balcarek, Petr Fiser, Jan Schmidt 2013

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8. Survey of Fault Simulation, Fault Grading and Test Pattern Generation Techniques with Emphasis on the Feasibility of VHDL Based Fault Simulation. [R] . Johnson, B. W., Smith, D. T., DeLong, T. A. 1997

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A Novel Reseeding Technique for Accumulator-based Test Pattern Generation

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