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Characterization of multilayer stack parameters from X-ray reflectivity data using the PPM program: measurements and comparison with TEM results

机译：使用ppm程序从X射线反射率数据表征多层叠层参数：测量和与TEm结果的比较

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D. Spigaa; A. Mironeb; G. Pareschia; R. Canestraria; V. Cotroneoa; C. Ferraric; C. Ferrerob; L. Lazzarinic; D. Vernania;
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1. Characterization of a layer stack by wavelet analysis on x-ray reflectivity data [J] . Smigiel E., Cornet A. Journal of Physics, D. Applied Physics: A Europhysics Journal . 2000,第15期

机译：通过对X射线反射率数据进行小波分析来表征叠层
2. Structure of PtFe/Fe double-period multilayers investigated by X-ray diffraction, reflectivity, diffuse scattering and TEM [J] . Zotov N, Feydt J, Walther T, Applied Surface Science . 2006,第1期

机译：通过X射线衍射，反射率，漫散射和TEM研究了PtFe / Fe双周期多层膜的结构
3. Structure and morphology of an organic/inorganic multilayer stack: An x-ray reflectivity study [J] . Alfred Neuhold, Stefanie Fladischer, Stefan Mitsche, Journal of Applied Physics . 2011,第11期

机译：有机/无机多层堆栈的结构和形态：X射线反射率研究
4. Characterization of multilayer stack parameters from X-ray reflectivity data using the PPM program: measurements and comparison with TEM results [C] . D. Spiga, A. Mirone, G. Pareschi, Space Telescopes and Instrumentation II: Ultraviolet to Gamma Ray pt.1 . 2006

机译：使用PPM程序根据X射线反射率数据表征多层堆叠参数：测量并与TEM结果进行比较
5. Ultra-short-period W/B(4)C multilayers for X-ray optics-microstructure limits on reflectivity. [D] . Walton, Christopher Charles. 1997

机译：用于X射线光学显微结构的超短周期W / B（4）C多层结构对反射率的限制。
6. X-ray reflectivity measurement of interdiffusion in metallic multilayers during rapid heating [O] . J. P. Liu, J. Kirchhoff, L. Zhou, -1

机译：快速加热过程中金属多层互扩散的X射线反射率测量
7. Characterization of multilayer stack parameters from X-ray reflectivity data using the PPM program: measurements and comparison with TEM results [O] . Spiga, D., Mirone, A., Pareschi, G., 2015

机译：从X射线反射率表征多层叠层参数使用ppm程序的数据：测量和与TEm结果的比较
8. Experimental Measurement of Metal Multilayer X-Ray Reflectivity Degradation Due to Intense X-Ray Flux [R] . Hockaday, M. Y. P. 1987

机译：强X射线通量导致金属多层X射线反射率降低的实验测量

Characterization of multilayer stack parameters from X-ray reflectivity data using the PPM program: measurements and comparison with TEM results

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