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High sensitivity ion beam analytical method for studying ion implanted SiC

机译：离子注入siC的高灵敏度离子束分析方法

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G. Battistig; J. Garcia Lopez; N. Q. Khanh; Y. Morilla; M. A. Respaldiza; E. Szilágyi;
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年度 2015
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1. Comparative ellipsometric and ion beam analytical studies on ion beam crystallized silicon implanted with Zn and Pb ions [J] . Tivadar Lohner, Christo Angelov, Valdek Mikli Thin Solid Films . 2008 ,第22期

机译：离子束结晶的注入Zn和Pb离子的硅的椭圆偏振和离子束比较研究
2. A nuclear reaction analysis and optical microscopy study on controlled growth of large SiC nanocrystals on Si formed by low-energy ion implantation and electron beam annealing [J] . A. Markwitz, F. Lucas, J. Rusterucci, Nuclear Instruments & Methods in Physics Research. B, Beam Interactions with Materials and Atoms . 2006 ,第Aug期

机译：通过低能离子注入和电子束退火在Si上控制生长大型SiC纳米晶体的核反应分析和光学显微镜研究
3. Pre-bent shape design of full free-form curved beams using isogeometric method and semi-analytical sensitivity analysis [J] . Hosseini Seyed Farhad, Moetakef-Imani Behnam, Hadidi-Moud Saeid, Structural and multidisciplinary optimization . 2018 ,第6期

机译：使用异处测定法和半分析敏感性分析预弯曲的形状设计全自由形式弯曲梁
4. High-Sensitivity Ion Beam Analytical Method for Studying Ion-Implanted SiC [C] . G. Battistig, J. Garcia Lopez, N.Q. Khanh, 4th European Conference on Silicon Carbide and Related Materials (ECSCRM 2002); Sep 2-5, 2002; Linkoeping, Sweden . 2002

机译：研究离子注入SiC的高灵敏度离子束分析方法
5. ANALYTICAL METHODS OF PROCESS ANALYSES INCLUDING TECHNIQUES FOR SENSITIVITY STUDIES AND QUADRATIC PROGRAMMING. [D] . SHETTY, CHITHARANJAN MARAKADA. 1961

机译：过程分析的分析方法，包括用于敏感性研究和二次编程的技术。
6. Study of an Online Plan Verification Method and the Sensitivity of Plan Delivery Accuracy to Different Beam Parameter Errors in Proton and Carbon Ion Radiotherapy [O] . Jun Zhao, Zhi Chen, Xianwei Wu, 2021

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7. Implantation temperature effects on the nanoscale optical pattern fabrication in a-SiC:H films by Ga+ focused ion beams [O] . Tsvetkova, T, Wright, CD, Hosseini, P, 2013

机译：Ga +聚焦离子束注入温度对a-SiC：H薄膜中纳米级光学图案制备的影响
8. Ion Implantation, Ion Beam Mixing, and Annealing Studies of Metals in Al sub 2 O sub 3 , SiC and Si sub 3 N sub 4 [R] . Appleton, B. R., Naramoto, H., White, C. W., 1983

机译：al sub 2 O sub 3，siC和si sub 3 N sub 4中金属的离子注入，离子束混合和退火研究

High sensitivity ion beam analytical method for studying ion implanted SiC

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