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Statistical modeling of pipeline delay and design of pipeline under process variation to enhance yield in sub 100nm technologies

机译：管道延迟统计建模与工艺变异管道设计提高亚100nm工艺产量

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Animesh Datta; Swarup Bhunia; Saibal Mukhopadhyay; Nilanjan Banerjee; Kaushik Roy;
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年度 2005
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专利

1. Delay Modeling and Statistical Design of Pipelined Circuit Under Process Variation [J] . Datta A., Bhunia S., Mukhopadhyay S., IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems . 2006,第期

机译：过程变化下流水线电路的延迟建模与统计设计
2. Statistical analysis of asynchronous pipelines in presence of process variation using formal models [J] . Mosaffa Mahdi, Mohammadi Siamak, Safari Saeed Integration . 2016,第SEPa期

机译：使用形式化模型对存在过程变化的异步管道进行统计分析
3. Design Of Pipelined RISC MIPS Processor Using VLSI Technology [J] . Nyamatulla M Patel, Sachin S Patil, Mamata A Navi, International Journal of Engineering Research and Applications . 2018,第9期

机译：基于VLSI技术的流水线RISC MIPS处理器设计
4. Statistical Modeling of Pipeline Delay and Design of Pipeline under Process Variation to Enhance Yield in sub-100nm Technologies [C] . Animesh Datta, Swarup Bhunia, Saibal Mukhopadhyay, International Conference on Advances in Computer Enterntainment Technology . 2009

机译：100nm以下工艺中延误的统计建模和工艺变化下的提高产量的管线设计
5. Statistical Models for Prediction of Mechanical Property and Manufacturing Process Parameters for Gas Pipeline Steels [D] . Dahire, Sonam. 2018

机译：燃气管道钢力学性能和制造工艺参数预测的统计模型
6. Which RNA-Seq Processing Algorithm Should I Pick? A Comparison of RNA-Seq Pipelines Based on Experimental Design Sample Properties and Sequencing Technology [O] . Zachary Banks, Vincent Butty, Stuart Levine 2013

机译：我应该选择哪种RNA-Seq处理算法？基于实验设计样品性质和测序技术的RNA-Seq管线比较
7. Statistical Modeling of Pipeline Delay and Design of Pipeline under Process Variation to Enhance Yield in sub-100nm Technologies [O] . Datta, Animesh, Bhunia, Swarup, Mukhopadhyay, Saibal, 2007

机译：管道延误统计模型与管道设计工艺变化提高亚100nm技术的产量

Statistical modeling of pipeline delay and design of pipeline under process variation to enhance yield in sub 100nm technologies

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