首页> 外文OA文献 >Low-energy ion-beam induced effects in Al(1 0 0) surface studied using Rutherford backscattering and channeling

【2h】

Low-energy ion-beam induced effects in Al(1 0 0) surface studied using Rutherford backscattering and channeling

机译：使用卢瑟福背散射和沟道研究在al（1 0 0）表面中的低能量离子束诱导效应

页面导航

著录项
引文网络
相似文献
相关主题

著录项

作者
C. V. Ramana; B. S. Choi; R. J. Smith;
展开▼
作者单位

展开▼
年度 2015
总页数
原文格式 PDF
正文语种
中图分类

相似文献

外文文献
中文文献
专利

1. Low-energy ion-beam induced effects in Al(100) surface studied using Rutherford backscattering and channeling [J] . Ramana CV., Choi BS., Smith RJ. Applied Surface Science . 2003,第1a4期

机译：使用Rutherford反向散射和沟道研究Al（100）表面中的低能离子束诱导效应
2. Depth dependent tetragonal distortion of a GaN epilayer with an AlN interlayer on Si(111) studied by Rutherford backscattering/channeling [J] . Huan Wang, Lina Hou, Shude Yao Thin Solid Films . 2014,第auga28期

机译：通过卢瑟福反向散射/沟道研究在Si（111）上具有AlN中间层的GaN外延层的深度依赖四方畸变
3. Tetragonal distortion of InAsPSb film grown on InAs substrate studied by Rutherford backscattering/channeling and synchrotron X-ray diffraction [J] . Cheng F., Fa T., Yao S., Physica, B. Condensed Matter . 2011,第17期

机译：通过卢瑟福反向散射/通道和同步加速器X射线衍射研究了InAs衬底上生长的InAsPSb薄膜的四方畸变
4. Comparative study of ion implantation caused anomalous surface damage in silicon studied by spectroscopic ellipsometry and Rutherford backscattering spectrometry [C] . T.Lohner, M.Fried, N.Q.Khanh, E-MRS meeting symposium J on ion implantation into semiconductors, oxides and ceramics . 1999

机译：离子注入的比较研究引起光谱椭圆形测定法和曲赫福硅硅的异常表面损伤 - 勘探光谱法
5. Spontaneous step creation on (001) silicon surfaces studied with scanning tunneling microscopy and low-energy electron microscopy. [D] . Jones, Darrell E. 1997

机译：利用扫描隧道显微镜和低能电子显微镜研究了在（001）硅表面上自发形成台阶的过程。
6. Oriented Nucleation of both Ge-Fresnoite and Benitoite/BaGe4O9 during the Surface Crystallisation of Glass Studied by Electron Backscatter Diffraction [O] . Wolfgang Wisniewski, Marek Patschger, Steliana Murdzheva, -1

机译：电子背向散射研究玻璃表面结晶过程中锗钙镁铁矿和贝氏体/ BaGe4O9的定向成核
7. SURFACE REACTIONS AND SURFACE ANALYSIS OF LITHIUM METAL AND ITS COMPOUNDS STUDIED BY AUGER ELECTRON SPECTROSCOPY, X-RAY PHOTOELECTRON SPECTROSCOPY AND RUTHERFORD BACKSCATTERING SPECTROMETRY (THERMAL BATTERIES). [O] . Burrow Bradley James 1984

机译：欧格电子能谱，X射线光电子能谱和拉特福德反散射谱（热电池）研究的锂及其化合物的表面反应和表面分析。

Low-energy ion-beam induced effects in Al(1 0 0) surface studied using Rutherford backscattering and channeling

著录项

引文网络

相似文献

相关主题

期刊订阅