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Raman microscopy investigations and electrical characterisation of indentation-induced phase transformations in silicon

机译：拉曼显微镜研究和硅中压痕诱导相变的电学表征

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Maha M. Khayyat; David G. Hasko; M. Munawar Chaudhri;
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年度 2015
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1. Raman microscopy investigations of structural phase transformations in crystalline and amorphous silicon due to indentation with a Vickers diamond at room temperature and at 77 K [J] . Khayyat MM., Banini GK., Hasko DG., Journal of Physics, D. Applied Physics: A Europhysics Journal . 2003,第11期

机译：拉曼显微镜研究在室温和77 K下由于维氏钻石的压痕导致的结晶和非晶硅结构相变
2. INVESTIGATIONS OF THE INDENTATION-INDUCED CRYSTALLOGRAPHIC PHASE CHANGES IN SILICON USING RAMAN SPECTROSCOPY [J] . M. M. CHAUDHRI, M. M. O. KHAYYAT, D. G. HASKO Surface review and letters . 2007,第4期

机译：用拉曼光谱法研究硅中压痕诱导的晶相变化
3. Correlation of indentation-induced phase transformations with the degree of relaxation of ion-implanted amorphous silicon [J] . Leonardus B. Bayu Aji, S. Ruffell, B. Haberl, Journal of Materials Research . 2013,第8期

机译：压痕诱导相变与离子注入非晶硅弛豫程度的相关性
4. Raman Microscopy Investigations and Electrical Characterisation of Indentation-Induced Phase Transformations in Silicon [C] . M.M. Khayyat, D.G. Hasko, M.M. Chaudhri International Meeting on Applied Physics . 2005

机译：硅中压痕诱导相变的拉曼显微镜调查和电学特性
5. TEM investigation of contact loading induced phase transformation in silicon. [D] . Ge, Daibin. 2004

机译：接触负载引起的硅相变的TEM研究。
6. Investigations of Phase Transformation in Monocrystalline Silicon at Low Temperatures via Nanoindentation [O] . Shunbo Wang, Hang Liu, Lixia Xu, -1

机译：纳米压痕研究低温下单晶硅的相变
7. Orientation study of iron phthalocyanine (FePc) thin films deposited on silicon substrate investigated by atomic force microscopy and micro-Raman spectroscopy [O] . M. Szybowicz, J. Makowiecki 2011

机译：原子力显微镜和显微拉曼光谱研究在硅衬底上沉积的酞菁铁薄膜的取向研究

Raman microscopy investigations and electrical characterisation of indentation-induced phase transformations in silicon

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