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Measurement results of within-die variations on a 90nm LUT array for speed and yield enhancement for reconfigurable devices

机译：90nm LUT阵列内芯片内变化的测量结果，可用于可重构器件的速度和良率提升

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Kazuya Katsuki; Manabu Kotani; Kazutoshi Kobayashi; Hidetoshi Onodera;
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年度 2006
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1. A 90 Nm 48 × 48 Lut-based Fpga Enhancing Speed And Yield Utilizing Within-die Delay Variations [J] . Kazutoshi KOBAYASHI, Kazuya KATSUKI, Manabu KOTANI, IEICE Transactions on Electronics . 2007,第10期

机译：基于管芯内延迟变化的90 Nm 48×48 Lut基Fpga提高速度和良率
2. Analysis of Within-Die Complementary Metal-Oxide-Semiconductor Process Variation with Reconfigurable Ring Oscillator Arrays Using HiSIM [J] . Tania Ansari, Wataru Imafuku, Akio Kawabata, Japanese journal of applied physics . 2011,第4ISSUE2期

机译：使用HiSIM的可重构环形振荡器阵列对模内互补金属氧化物半导体工艺变化的分析
3. Within-Die Gate Delay Variability Measurement Using Reconfigurable Ring Oscillator [J] . Das B.P., Amrutur B., Jamadagni H.S., Semiconductor Manufacturing, IEEE Transactions on . 2009,第2期

机译：使用可重配置环形振荡器的模内栅极延迟可变性测量
4. Measurement results of within-die variations on a 90nm LUT array for speed and yield enhancement of reconfigurable devices [C] . Kazuya Katsuki, Manabu Kotani, Kazutoshi Kobayashi, Conference on Asia South Pacific design automation . 2006

机译：90nm LUT阵列上芯片内变化的测量结果，可提高可配置设备的速度和良率
5. Effect on Speed Distribution due to Intrusive and Non-Intrusive Portable Speed Measurement Devices. [D] . Jasrotia, Romika. 2011

机译：侵入式和非侵入式便携式速度测量设备对速度分布的影响。
6. Linear array measurements of enhanced dynamic wedge and treatment planning system (TPS) calculation for 15 MV photon beam and comparison with electronic portal imaging device (EPID) measurements [O] . Borislava Petrovic, Aleksandra Grzadziel, Laza Rutonjski, 2010

机译：用于15 MV光子束的增强型动态楔形和治疗计划系统（TPS）计算的线性阵列测量并与电子门成像设备（EPID）测量进行比较
7. Measurement results of within-die variations on a 90nm LUT array for speed and yield enhancement for reconfigurable devices [O] . Kazuya Katsuki, Manabu Kotani, Kazutoshi Kobayashi, 2006

机译：90nm LUT阵列内芯片内变化的测量结果，可用于可重构器件的速度和良率提升
8. Reconfigurable computer array: The bridge between high speed sensors and low speed computing [R] . Robinson, S. H. , Caffrey, M. P. , Dunham, M. E. 1998

机译：可重构计算机阵列：高速传感器与低速计算之间的桥梁

Measurement results of within-die variations on a 90nm LUT array for speed and yield enhancement for reconfigurable devices

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