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A built-in redundancy-analysis scheme for self-repairable RAMs with two-level redundancy

机译：内置冗余分析方案，用于具有两级冗余的自修复Ram

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Yu-jen Huang; Da-ming Chang; Jin-fu Li;
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年度 2006
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1. A Built-in Redundancy-Analysis Scheme for Random Access Memories with Two-Level Redundancy [J] . Da-Ming Chang, Jin-Fu Li, Yu-Jen Huang Journal of Electronic Testing: Theory and Applications: Theory and Applications . 2008,第1a3期

机译：具有两级冗余的随机访问存储器的内置冗余分析方案
2. A Built-In Redundancy-Analysis Scheme for Random Access Memories with Two-Level Redundancy [J] . Da-Ming Chang, Jin-Fu Li, Yu-Jen Huang Journal of Electronic Testing . 2008,第1a3期

机译：具有两级冗余的随机访问存储器的内置冗余分析方案
3. A Low-Cost Built-In Redundancy-Analysis Scheme for Word-Oriented RAMs With 2-D Redundancy [J] . Tseng T.-W., Li J.-F. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on . 2011,第11期

机译：具有二维冗余的面向字RAM的低成本内置冗余分析方案
4. A Built-In Redundancy-Analysis Scheme for Self-Repairable RAMs with Two-Level Redundancy [C] . Yu-Jen Huang, Da-Ming Chang, Jin-Fu Li IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems . 2006

机译：具有两级冗余的自我修复RAM的内置冗余分析方案
5. Built-in schemes for test pattern generation and fault location [D] . Udar, Snehal 2011

机译：测试模式生成和故障位置的内置方案
6. Two-Level Optical Coherence Tomography Scheme for Suppressing Spectral Saturation Artifacts [O] . Chiung-Ting Wu, Meng-Tsan Tsai, Cheng-Kuang Lee 2014

机译：抑制光谱饱和伪影的两级光学相干层析成像方案
7. A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap [O] . Jin-fu Li, See Profile, Tsu-wei Tseng, 2006

机译：内置的冗余分析方案，用于使用1D本地位图的2D冗余Ram

A built-in redundancy-analysis scheme for self-repairable RAMs with two-level redundancy

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