首页> 外文OA文献 >BAND EDGE TRAPS AT SPECTROSCOPICALLY-DETECTED O-ATOM VACANCIES IN NANOCRYSTALLINE ZrO2 and HfO2: AN ENGINEERING SOLUTION FOR ELIMINATION OF O-ATOM VACANCY DEFECTS IN NON-CRYSTALLINE TERNARY SILICATE ALLOYS
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BAND EDGE TRAPS AT SPECTROSCOPICALLY-DETECTED O-ATOM VACANCIES IN NANOCRYSTALLINE ZrO2 and HfO2: AN ENGINEERING SOLUTION FOR ELIMINATION OF O-ATOM VACANCY DEFECTS IN NON-CRYSTALLINE TERNARY SILICATE ALLOYS

机译:在纳米晶ZrO2和HfO2中光谱检测O原子空位的带边缘陷阱:消除非结晶三价硅酸盐合金中O原子空位缺陷的工程解决方案

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