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Prototype of atomic force microscope with high resolution optical microscope for observing magnetic nanodot arrays

机译：用高分辨率光学显微镜观察磁纳米点阵列的原子力显微镜原型

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Tao Jin A; Ryosuke Takahashi B; Hui Zhang C; You Yin D;
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年度 2016
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1. Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution [J] . Karci Ozgur, Dede Munir, Oral Ahmet Review of Scientific Instruments . 2014,第10期

机译：具有10 nm磁力显微镜分辨率的自对准，宽温度范围（300 mK-300 K）原子力显微镜/磁力显微镜的设计
2. Joint Operation of Atomic Force Microscope and Advanced Laser Confocal Microscope for Observing Surface Processes in a Protein Crystal [J] . Shin-ichiro Yanagiya, Nobuo Goto Journal of surface engineered materials and advanced technology . 2012,第3期

机译：原子力显微镜和高级激光共聚焦显微镜的联合操作，用于观察蛋白质晶体中的表面过程
3. A compact nano manipulator based on an atomic force microscope coupling with a scanning electron microscope or an inverted optical microscope [J] . Futoshi Iwata, Yuya Mizuguchi, Hideyuki Ko, Journal of Micro - Nano Mechatronics . 2013,第1期

机译：基于原子力显微镜与扫描电子显微镜或倒置光学显微镜耦合的紧凑型纳米操纵器
4. Prototype of atomic force microscope with high resolution optical microscope for observing magnetic nanodot arrays [C] . Tao Jin, Ryosuke Takahashi, Hui Zhang International Conference on Advanced Micro-Device Engineering . 2015

机译：具有高分辨率光学显微镜的原子力显微镜原型，用于观察磁NANOTOT阵列
5. Development of a Hybrid Atomic Force and Scanning Magneto-Optic Kerr Effect Microscope for Investigation of Magnetic Domains. [D] . Lawrence, Andrew James. 2011

机译：用于研究磁畴的混合原子力和扫描磁光克尔效应显微镜的开发。
6. Optimizing 1-μs-Resolution Single-MoleculeForce Spectroscopy on a Commercial Atomic Force Microscope [O] . Devin T. Edwards, Jaevyn K. Faulk, Aric W. Sanders, -1

机译：优化1μs分辨率单分子商业原子力显微镜上的力谱
7. High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy [O] . Oral, A., Grimble, R. A., Ozer, H. O., 2003

机译：高灵敏度非接触原子力显微镜/扫描隧道显微镜（nc AFM / STM），工作于亚埃振荡振幅，用于原子分辨率成像和力谱

Prototype of atomic force microscope with high resolution optical microscope for observing magnetic nanodot arrays

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