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Optical Second Harmonic Generation as a tool for in-situ, real-time monitor of thin film epitaxial growth

机译：光学二次谐波产生作为薄膜外延生长的原位实时监测工具

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Andrea Rubano; Tim Günter; Martin Lilienblum; Domenico Paparo; Lorenzo Marrucci; Fabio Miletto Granozio; Umberto Scotti Di Uccio; Manfred Fiebig;
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1. Optical second harmonic imaging as a diagnostic tool for monitoring epitaxial oxide thin-film growth [J] . Rubano Andrea, Guenter Tim, Lilienblum Martin, Applied Surface Science . 2015,第feba1期

机译：光学二次谐波成像作为监测外延氧化物薄膜生长的诊断工具
2. Optical real-time monitoring of the laser molecular-beam epitaxial growth of perovskite oxide thin films by an oblique-incidence reflectance-difference technique [J] . Chen F., Chen ZH., Zhao T., Journal of the Optical Society of America, B. Optical Physics . 2001,第7期

机译：斜入射反射差技术实时监测钙钛矿氧化物薄膜的激光分子束外延生长
3. Nonlinear optical properties and domain microstructure of epitaxial SrBi_(2)Nb_(2)O_(9) thin films on SrTiO_(3) and on MgO substrates studied by second-harmonic generation [J] . Optics Communications: A Journal Devoted to the Rapid Publication of Short Contributions in the Field of Optics and Interaction of Light with Matter . 2003,第1a6期

机译：利用二次谐波产生研究SrTiO_（3）和MgO衬底上外延SrBi_（2）Nb_（2）O_（9）薄膜的非线性光学性质和畴微结构
4. Laser reflectometry for in-situ monitoring of the epitaxial growth of thin films [C] . Trevor Farrell, Liverpool Univ., Liverpool, Laser-Induced Thin-Film Processing . 1995

机译：激光反射仪用于原位监测薄膜的外延生长
5. Ultrafast third-harmonic generation from nanostructured optical thin films and interfaces. [D] . Stoker, David Stevens. 2006

机译：由纳米结构的光学薄膜和界面产生超快的三次谐波。
6. An In-situ Real-Time Optical Fiber Sensor Based on Surface Plasmon Resonance for Monitoring the Growth of TiO2 Thin Films [O] . Yu-Chia Tsao, Woo-Hu Tsai, Wen-Ching Shih, 2013

机译：基于表面等离子共振的原位实时光纤传感器用于监测TiO2薄膜的生长
7. An In-situ Real-Time Optical Fiber Sensor Based on Surface Plasmon Resonance for Monitoring the Growth of TiO2 Thin Films [O] . Wen-Ching Shih, Mu-Shiang Wu, Woo-Hu Tsai, 2013

机译：基于表面等离子共振的原位实时光纤传感器用于监测TiO2薄膜的生长

Optical Second Harmonic Generation as a tool for in-situ, real-time monitor of thin film epitaxial growth

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