首页> 外文OA文献 >Optical properties of Electrodeposited alumina thin films by using Spectroscopic Ellipsometer

【2h】

Optical properties of Electrodeposited alumina thin films by using Spectroscopic Ellipsometer

机译：光谱椭偏仪测定电沉积氧化铝薄膜的光学性质

页面导航

著录项
引文网络
相似文献
相关主题

著录项

作者
Farzana Majid; Saira Riaza; Shahzad Naseem;
展开▼
作者单位

展开▼
年度 2016
总页数
原文格式 PDF
正文语种
中图分类

相似文献

外文文献
中文文献
专利

1. The optical constant of ZnSe/SiO{sub}2 composite thin films investigated by spectroscopic ellipsometers [J] . Hai-qing Jiang, Xi Yao, Jun Che, Journal of electroceramics . 2008,第1a4期

机译：光谱椭偏仪研究ZnSe / SiO {sub} 2复合薄膜的光学常数
2. The optical constant of ZnSe/SiO2 composite thin films investigated by spectroscopic ellipsometers [J] . Hai-qing Jiang, Xi Yao, Jun Che, Journal of Electroceramics . 2008,第1a4期

机译：椭圆偏振光谱仪研究ZnSe / SiO2 复合薄膜的光学常数
3. Spectroscopic Characterization of Electrodeposited Poly(o-toluidine) Thin Films and Electrical Properties of ITO/Poly(o-toluidine)/Aluminum Schottky Diodes [J] . A.Elmansouri, A.Outzourhit, A.Oueriagli, Active and passive electronic components . 2007,第2期

机译：电沉积聚（邻甲苯胺）薄膜的光谱表征和ITO /聚（邻甲苯胺）/铝肖特基二极管的电性能
4. Optical properties of Electrodeposited alumina thin films by using Spectroscopic Ellipsometer [C] . FARZANA Majid, SAIRA Riaz, SHAHZAD Naseem International Conference on Chemical, Mechanical and Materials Engineering . 2013

机译：使用光谱椭圆仪电沉积氧化铝薄膜的光学性质
5. Development of a UV extended real time spectroscopic ellipsometer and its use for characterization of boron nitride thin films [D] . Zapien, Juan Antonio 2000

机译：紫外扩展实时椭偏仪的研制及其在氮化硼薄膜表征中的应用
6. Tailoring magnetic properties of electrodeposited thin films of the molecule-based magnet Cr5.5(CN)12 11.5H2O [O] . Helena Prima-Garcia, Eugenio Coronado, Juan P Prieto-Ruiz, 2012

机译：分子基磁体Cr5.5（CN）12 11.5H2O的电沉积薄膜的定制磁性能
7. The effect of annealing on structural, optical and photosensitive properties of electrodeposited cadmium selenide thin films [O] . Somnath Mahato, Asit Kumar Kar 2017

机译：退火对电沉积硒化镉薄膜结构，光学和光敏性能的影响
8. Determination of the Optical Properties of Organic Thin Films by Spectroscopic Ellipsometry. [R] . Sward, M. L. 1990

机译：光谱椭偏法测定有机薄膜的光学性质。

Optical properties of Electrodeposited alumina thin films by using Spectroscopic Ellipsometer

著录项

引文网络

相似文献

相关主题

期刊订阅