首页> 外文OA文献 >Characterization of Electron Emission from High Density Self-aligned Si-based Quantum Dots by Conducting-Probe Atomic Force Microscopy

【2h】

Characterization of Electron Emission from High Density Self-aligned Si-based Quantum Dots by Conducting-Probe Atomic Force Microscopy

机译：用导电探针原子力显微镜表征高密度自对准硅基量子点的电子发射

页面导航

著录项
引文网络
相似文献
相关主题

著录项

作者
Daichi Takeuchia; Katsunori Makiharaa; Akio Ohtab; Mitsuhisa Ikedac; Seiichi Miyazakia;
展开▼
作者单位

展开▼
年度 2016
总页数
原文格式 PDF
正文语种
中图分类

相似文献

外文文献
中文文献
专利

1. Characterization of Local Electronic Transport through Ultrathin Au/Highly-Dense Si Nanocolumnar Structures by Conducting-Probe Atomic Force Microscopy [J] . Daichi Takeuchi, Katsunori Makihara, Mitsuhisa Ikeda, IEICE Transactions on Electronics . 2013,第5期

机译：超薄金/高密度硅纳米柱结构通过传导探针原子力显微镜表征局部电子传输。
2. Cross-sectional transmission electron microscopy analysis of a single self-assembled quantum dot single electron transistor fabricated by atomic force microscope local oxidation [J] . Rai Moriya, Eriko Ikenaga, Kenji Shibata, Japanese journal of applied physics . 2014,第4期

机译：原子力显微镜局部氧化制备的单个自组装量子点单电子晶体管的截面透射电镜分析
3. Resonant tunneling of electrons through single self-assembled InAs quantum dot studied by conductive atomic force microscopy [J] . Tanaka I., Tada Y., Nakatani S., Physica, E. Low-dimensional systems & nanostructures . 2010,第10期

机译：电子通过单个自组装InAs量子点的共振隧穿，通过导电原子力显微镜研究
4. Characterization of Electron Emission from High Density Self-aligned Si-based Quantum Dots by Conducting-Probe Atomic Force Microscopy [C] . Daichi Takeuchi, Katsunori Makihara, Akio Ohta, SiGe, Ge, and related compounds: materials, processing, and devices symposium;Meeting of The Electrochemical Society . 2014

机译：高密度自对准硅基量子点的电子发射特性的传导探针原子力显微镜表征
5. Conductive atomic force microscopy study of single semiconductor quantum dots and quantum dot aggregates. [D] . Wang, Tuo. 2014

机译：单个半导体量子点和量子点聚集体的导电原子力显微镜研究。
6. Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy [O] . Lynda Cockins, Yoichi Miyahara, Steven D. Bennett, 2010

机译：原子力显微镜成像和表征的少数电子量子点的能级
7. Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy [O] . Cockins, Lynda, Miyahara, Yoichi, Bennet, Steven D., 2010

机译：原子力显微镜成像和表征的少数电子量子点的能级

Characterization of Electron Emission from High Density Self-aligned Si-based Quantum Dots by Conducting-Probe Atomic Force Microscopy

著录项

引文网络

相似文献

相关主题

期刊订阅