首页> 外文OA文献 >Analysis of LDMOS for Effect of Fingers, Device-Width and Inductance (Load) on Reverse Recovery

【2h】

Analysis of LDMOS for Effect of Fingers, Device-Width and Inductance (Load) on Reverse Recovery

机译：手指，器件宽度和电感（负载）对反向恢复影响的LDmOs分析

页面导航

著录项
相似文献
相关主题

著录项

作者
Mohammed Sadique Anwar; Prima Sukma Permata; Md. Imran Siddiqui; Jung-ruey Tsai; Shao-ming Yang; Gene Sheu;
展开▼
作者单位

展开▼
年度 2016
总页数
原文格式 PDF
正文语种
中图分类

相似文献

外文文献
中文文献
专利

1. Gate-Controlled Reverse Recovery for Characterization of LDMOS Body Diode [J] . Elhami Khorasani A., Griswold M., Alford T.L. Electron Device Letters, IEEE . 2014,第11期

机译：栅极控制的反向恢复以表征LDMOS体二极管
2. Methods for Calculation of Inductances in the Input Matching Circuit of a Powerful HF (UHF) LDMOS Transistor [J] . O. M. Bulgakov, B. K. Petrov Telecommunications and Radio Engineering . 2008,第9期

机译：强大的HF（UHF）LDMOS晶体管输入匹配电路中电感的计算方法
3. An LDMOS VHF class-E power amplifier using a high-Q novel variable inductor [J] . Zirath H., Rutledge D.B. IEEE Transactions on Microwave Theory and Techniques . 1999,第12期

机译：使用高Q新型可变电感器的LDMOS VHF E类功率放大器
4. Analysis of LDMOS for Effect of Fingers, Device-Width and Inductance (Load) on Reverse Recovery [C] . Mohammed Sadique Anwar, Prima Sukma Permata, Md. Imran Siddiqui, International Conference on Mechanical and Electrical Technology . 2012

机译：反向恢复对手指，装置宽度和电感（负载）影响的LDMOS分析
5. Energy Recovery Devices in Seawater Reverse Osmosis Desalination Plants with Emphasis on Efficiency and Economical Analysis of Isobaric versus Centrifugal Devices [D] . Guirguis, Mageed Jean 2011

机译：海水反渗透海水淡化厂的能量回收装置，着重于等压与离心装置的效率和经济性分析
6. A Comparison of Frequency Pullability in Oscillators Using a Single AT-Cut Quartz Crystal and Those Using Two Single AT-Cut Crystals Connected in Parallel with a Series Load Capacitance or Series Load Inductance [O] . Vojko Matko 2006

机译：使用单个AT-Cut石英晶体的振荡器和使用两个带有串联负载电容或串联负载电感并联的单个AT-Cut晶体的振荡器的频率可拉性的比较
7. A Virtual Instrument Environment to Characterize Reverse Recovery Parameters in LDMOS Devices [O] . Carlos J. Bernal, Manuel Jiménez 2016

机译：虚拟仪器环境，用于在LDMOS设备中表征反向恢复参数

Analysis of LDMOS for Effect of Fingers, Device-Width and Inductance (Load) on Reverse Recovery

著录项

相似文献

相关主题

期刊订阅