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Definitions of the numbers of detections of target faults and their effectiveness in guiding test generation for high defect coverage

机译：目标故障检测次数的定义及其指导高缺陷覆盖率测试生成的有效性

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Irith Pomeranz; Sudhakar M. Reddy;
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年度 2001
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1. A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint [J] . Ryoichi INOUE, Toshinori HOSOKAWA, Hideo FUJIWARA IEICE transactions on information and systems . 2010,第1期

机译：在测试长度约束下状态可观的FSM增加故障覆盖率的故障相关测试生成方法
2. A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint [J] . Ryoichi INOUE, Toshinori HOSOKAWA, Hideo FUJIWARA IEICE Transactions on Information and Systems . 2010,第1期

机译：在测试长度约束下状态可观的FSM增加故障覆盖率的故障相关测试生成方法
3. A quest for appropriate software fault models: Case studies on fault detection effectiveness of model-based test generation techniques [J] . Amit Paradkar Information and software technology . 2006,第10期

机译：寻求合适的软件故障模型：基于模型的测试生成技术的故障检测有效性的案例研究
4. Definitions of the numbers of detections of target faults and their effectiveness in guiding test generation for high defect coverage [C] . I. Pomeranz, S. Reddy Workshop on Embedded Systems Education . 2009

机译：目标故障的检测次数的定义及其在指导缺陷高覆盖率测试生成方面的有效性
5. Maximizing nontarget defect detection using conventional stuck-at fault-based automated test pattern generation tools. [D] . Grimaila, Michael Russell. 1999

机译：使用传统的基于故障卡住的自动测试模式生成工具来最大化非目标缺陷检测。
6. A testing-coverage software reliability model considering fault removal efficiency and error generation [O] . Qiuying Li, Hoang Pham 2011

机译：考虑故障排除效率和错误产生的测试覆盖软件可靠性模型
7. Novel MC/DC Coverage Test Sets Generation Algorithm, and MC/DC Design Fault Detection Strength Insights [O] . Salem Mohamed A., Eder Kerstin I. 2016

机译：新颖的MC / DC覆盖测试集生成算法和MC / DC设计故障检测强度洞察力
8. CMOS IC fault models, physical defect coverage, and I(sub DDQ) testing. [R] . R. R. Fritzemeier J. M. Soden C. F. Hawkins 1991

机译：CmOs IC故障模型，物理缺陷覆盖和I（子DDQ）测试。

Definitions of the numbers of detections of target faults and their effectiveness in guiding test generation for high defect coverage

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