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Faulty Behavior of Storage Elements and Its Effects on Sequential Circuits

机译：存储元件的故障行为及其对时序电路的影响

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Waleed K. Al-assadi; Student Member; Yashwant K Malaiya; Senior Member; Anura P. Jayasumana;
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年度 1993
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1. Faulty behavior of storage elements and its effects on sequential circuits [J] . Al-Assadi W.K., Malaiya Y.K. IEEE transactions on very large scale integration (VLSI) systems . 1993,第4期

机译：存储元件的错误行为及其对时序电路的影响
2. ECL storage elements: modeling of faulty behavior [J] . Menon S.M., Malaiya Y.K., Jayasumana A.P. IEEE Transactions on Circuits and Systems. II, Express Briefs . 1997,第11期

机译：ECL存储元素：错误行为的建模
3. ECL storage elements: modeling of faulty behavior [J] . Menon S.M., Malaiya Y.K. IEEE Transactions on Circuits and Systems. II . 1997,第11期

机译：ECL存储元素：错误行为的建模
4. Modeling of faulty behavior of ECL storage elements [C] . Menon, S.M., Malaiya, . 1993

机译：ECL存储元素的错误行为建模
5. Analysis and Design of Robust Storage Elements in Nanometric Circuits. [D] . Lin, Sheng. 2011

机译：纳米电路中鲁棒存储元件的分析和设计。
6. Predicting the behavior of microfluidic circuits made from discrete elements [O] . Krisna C. Bhargava, Bryant Thompson, Danish Iqbal, -1

机译：预测由分立元件制成的微流体电路的行为
7. Edge-Triggered Logical Elements and Their Applications to Realization of Asynchronous Sequential Circuits [O] . 滑川英世 / 櫛田敏夫, ナメカワヒデヨ / クシダトシオ, NAMEKAWA hideyo / KUSHIDA toshio 1984

机译：边沿触发逻辑元件及其在异步时序电路实现中的应用
8. EBW1: A Computer Code for the Prediction of the Behavior of Electrical Circuits Containing Exploding Wire Elements [R] . Tucker, T. J., Toth, R. P. 1975

机译：EBW1：用于预测含有爆炸线元件的电路行为的计算机代码

Faulty Behavior of Storage Elements and Its Effects on Sequential Circuits

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