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Accurate On Wafer Measurement Of Phase And Amplitude Of The Spectral Components Of Incident And Scattered Voltage Waves At the Signal Ports Of A Nonlinear Microwave Device

机译：精确测量非线性微波器件信号端口入射和散射电压波谱分量的相位和幅度

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Jan Verspecht; Peter Debie; Alain Barel; Luc Martens;
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年度 1995
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1. Thru-less calibration algorithm and measurement system for on-wafer large-signal characterisation of microwave devices [J] . El-Deeb W.S., Hashmi M.S., Smida S.B., Microwaves, Antennas & Propagation, IET . 2010,第11期

机译：微波器件在片大信号表征的无孔校准算法和测量系统
2. Frequency-Domain Models for Nonlinear Microwave Devices Based on Large-Signal Measurements [J] . Jeffrey A. Jargon, Donald C. DeGroot, K. C. Gupta Journal of Research of the National Institute of Standards and Technology . 2004,第4期

机译：基于大信号测量的非线性微波设备的频域模型
3. SYNTHESIS OF RESISTIVE MATCHING DEVICES OF PHASE DEMODULATORS WITH THE SPECIFIC MODULATION DEPTH OF THE AMPLITUDE-AND-PHASE- MODULATED SIGNAL, USING A THREE- POLE NONLINEAR ELEMENT: The Nonlinear Element Included between the Matching Device and the High-Frequency Load* [J] . A. A. Golovkov, V. I. Gaidukov Telecommunications and Radio Engineering . 2011,第6期

机译：使用三极非线性元件，合成具有相位和相位调制信号的特定调制深度的相位解调器的电阻匹配设备：匹配设备和高频负载之间包含一个非线性元素
4. Accurate on wafer measurement of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device [C] . Verspecht, J., Debie, . 1995

机译：在晶片上精确测量非线性微波设备信号端口处入射和散射电压波的频谱分量的相位和幅度
5. A Multi-Port Measurement System for Large-Signal Characterization of Microwave Devices. [D] . El-Deeb, Walid Saber Abdel Aleam Ibrahim. 2011

机译：用于微波设备大信号表征的多端口测量系统。
6. Frequency-Domain Models for Nonlinear Microwave Devices Based on Large-Signal Measurements [O] . Jeffrey A. Jargon, Donald C. DeGroot, K. C. Gupta 2004

机译：基于大信号测量的非线性微波器件频域模型
7. Frequency-domain models for nonlinear microwave devices based on large-signal measurements [O] . J.A. Jargon, D.C. DeGroot, K.C. Gupta 2004

机译：基于大信号测量的非线性微波器件频域模型

Accurate On Wafer Measurement Of Phase And Amplitude Of The Spectral Components Of Incident And Scattered Voltage Waves At the Signal Ports Of A Nonlinear Microwave Device

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