Development of high-resolution alternating magnetic force microscopy and its application to advanced magnetic materials and devices

摘要

We have developed novel magnetic force microscopy named as alternating magnetic force microscopy (A-MFM) for DCand AC magnetic fields imaging with ultra high spatial resolution of less than 5 nm. A-MFM utilizes frequency modulation ofcantilever oscillation induced by applying off-resonant alternating magnetic force to high sensitive homemade magnetic tip.A-MFM is the first magnetic force microscopy which enables near-surface magnetic imaging. A-MFM has several newfunctionalities such as, a) zero detection of magnetic field, b) polarity detection of magnetic field, c) stroboscopic AC magneticfield imaging and d) vector DC magnetic fields imaging with selectable measuring axis.