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Effect of Tetragonality on The Capacitance Aging of Multilayer Ceramic Capacitors with Ni Internal Electrodes

机译:四方性对带镍内电极的多层陶瓷电容器电容老化的影响

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摘要

Effect of tetragonality on the capacitance aging under dc field has been studied.BaTi03 -based dielectrics with X7R characteristics and Y5V characteristicsfor multilayer ceramic capacitors (MLCCs) with Ni internal electrodes have been used for this study. Capacitance change strongly depends on grain size and temperature. It is supported that these factors affect tetragonality, and the change of tetragonality causes variation of capacitance change. New equation for capacitance aging is proposed considering the effect of particle volume, temperature, dc electric field and tetragonality. Effect of internal stress of MLCCs is also discussed. Capacitance change is also a function of internal stress.
机译:研究了四方性对直流电场下电容老化的影响。本研究使用具有X7R特性和Y5V特性的BaTi03基电介质,用于带有Ni内部电极的多层陶瓷电容器(MLCC)。电容变化在很大程度上取决于晶粒尺寸和温度。支持这些因素影响四方性,并且四方性的变化引起电容变化的变化。考虑粒子体积,温度,直流电场和四方性的影响,提出了电容老化的新方程。还讨论了MLCC内部应力的影响。电容变化也是内部应力的函数。

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