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Atomic Resolution Transmission Electron Microscopy of the Intergranular Structure of a Y2O3- Containing Silicon Nitride Ceramic

机译：含Y2O3的氮化硅陶瓷的晶间结构的原子分辨透射电镜

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A. Ziegler; C. Kisielowski; M. J. Hoffmann; R. O. Ritchie;
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年度 2003
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1. Dynamic behavior of nanometer-scale amorphous intergranular film in silicon nitride by in situ high-resolution transmission electron microscopy [J] . Zaoli Zhang, Wilfried Sigle, Christoph T. Koch Journal of the European Ceramic Society . 2011,第9期

机译：原位高分辨率透射电子显微镜在氮化硅中纳米级非晶晶间膜的动态行为
2. Atomic-resolution scanning transmission electron microscopy through50-nm-thick silicon nitride membranes [J] . Ranjan Ramachandra, Hendrix Demers, Niels de Jonge Applied Physics Letters . 2011,第9期

机译：50纳米厚氮化硅膜的原子分辨率扫描透射电子显微镜
3. Transmission Electron Microscopy of Intergranular Regions of Corroded Silicon Nitride [J] . A. D. Stalios, J. Luyten, F. L. Riley, Journal of the European Ceramic Society . 1995,第6期

机译：腐蚀氮化硅晶界区域的透射电子显微镜
4. Ultra-High-Resolution Transmission Electron Microscopy of Atomically Thin Hexagonal Boron Nitride (h-BN) [C] . N. Alem, R. Erni, C. Kisielowski, Microscopy and microanalysis.;Microscopy and microanalysis. . -1

机译：原子稀薄六方氮化硼（h-BN）的超高分辨率透射电子显微镜
5. High-resolution analytical electron microscopy and creep deformation of silicon nitride ceramics. [D] . Jin, Qiang. 1998

机译：高分辨率分析电子显微镜和氮化硅陶瓷的蠕变变形。
6. Atomic-resolution scanning transmission electron microscopy through 50-nm-thick silicon nitride membranes [O] . Ranjan Ramachandra, Hendrix Demers, Niels de Jonge -1

机译：50纳米厚氮化硅膜的原子分辨率扫描透射电子显微镜
7. Atomic-resolution scanning transmission electron microscopy through 50-nm-thick silicon nitride membranes [O] . Ramachandra, Ranjan, Demers, Hendrix, de Jonge, Niels 2011

机译：50纳米厚氮化硅膜的原子分辨率扫描透射电子显微镜

Atomic Resolution Transmission Electron Microscopy of the Intergranular Structure of a Y2O3- Containing Silicon Nitride Ceramic

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