首页> 外文OA文献 >A fast sequential learning technique for real circuits with application to enhancing ATPG performance

【2h】

A fast sequential learning technique for real circuits with application to enhancing ATPG performance

机译：一种用于实际电路的快速顺序学习技术，可用于增强ATPG性能

页面导航

著录项
引文网络
相似文献
相关主题

著录项

作者
Aiman El-maleh; Mark Kassab; Janusz Rajski;
展开▼
作者单位

展开▼
年度 1998
总页数
原文格式 PDF
正文语种
中图分类

相似文献

外文文献
中文文献
专利

1. Application of genetically engineered finite-state-machine sequences to sequential circuit ATPG [J] . Hsiao M.S., Rudnick E.M. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems . 1998,第3期

机译：基因工程有限状态机序列在时序电路ATPG中的应用
2. A Method of Test Generation for Acyclic Sequential Circuits Using Single Stuck-at Fault Combinational ATPG [J] . Hideyuki ICHIHARA, Tomoo INOUE IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences . 2003,第12期

机译：基于单滞留故障组合式ATPG的非循环时序电路测试生成方法
3. Test generation for acyclic sequential circuits using combinational ATPG for single stuck-at faults [J] . Hideyuki Ichihara, Tomoo Inoue, Akio Tamura 電子情報通信学会技術研究報告. VLSI設計技術. VLSI Design Technologies . 2000,第473期

机译：使用组合式ATPG进行非循环时序电路测试以解决单个卡死故障
4. A fast sequential learning technique for real circuits with application to enhancing ATPG performance [C] . El-Maleh A., Kassab M., Rajski J. Numerical Simulation of Optoelectronic Devices, 2004. NUSOD '04 . 2004

机译：一种用于实际电路的快速顺序学习技术，可用于增强ATPG性能
5. Application specific performance enhancements of digital and mixed-signal CMOS circuits using optoelectronic techniques. [D] . Patru, Dorin. 2002

机译：使用光电技术增强了数字和混合信号CMOS电路的专用性能。
6. MR Diagnosis of Facial Neuritis: Diagnostic Performance of Contrast-Enhanced 3D-FLAIR Technique Compared with Contrast-Enhanced 3D-T1-Fast-Field Echo with Fat Suppression [O] . H.K. Lim, J.H. Lee, D. Hyun, 2012

机译：面部神经炎的诊断：与脂肪抑制的对比度增强3D-T1 - 快车型回声相比对比增强3D-Flair技术的诊断性能
7. A fast sequential learning technique for real circuits with application to enhancing ATPG performance [O] . Aiman El-maleh, Mark Kassab, Janusz Rajski 1998

机译：用于实际电路的快速顺序学习技术，用于增强aTpG性能
8. Analysis of Multiple Faults in Synchronous Sequential Circuits by Boolean Difference Techniques [R] . Goldstein, L. H. 1978

机译：用布尔差分技术分析同步时序电路中的多个故障

A fast sequential learning technique for real circuits with application to enhancing ATPG performance

著录项

引文网络

相似文献

相关主题

期刊订阅