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CHARACTERIZING PROCESS SEMICONDUCTOR THIN FILMS WITH A CONFOCAL MICRO X-RAY FLUORESCENCE MICROSCOPE

机译：用共聚焦微X射线荧光显微镜表征过程半导体薄膜

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Chris M. Sparks; Elizabeth P. Hastings; George J. Havrilla; Michael Beckstead;
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年度 2013
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专利

1. Characterizing process semiconductor thin films with a confocal micro X-ray fluorescence microscope [J] . Chris M. Sparks, Elizabeth P. Hastings, George J. Havrilla, Powder diffraction . 2006,第2期

机译：用共聚焦微X射线荧光显微镜表征工艺半导体薄膜
2. Non-destructive characterisation of the Elephant Moraine 83227 meteorite using confocal Raman, micro-energy-dispersive X-ray fluorescence and Raman-scanning electron microscope-energy-dispersive X-ray microscopies [J] . Torre-Fdez Imanol, Aramendia Julene, Gomez-Nubla Leticia, Analytical and bioanalytical chemistry . 2018,第28期

机译：使用共焦拉曼的大象冰碛83227陨石的非破坏性表征，微能分散X射线荧光和拉曼扫描电子显微镜 - 能量分散X射线微观微观
3. Three-dimensional X-ray fluorescence imaging with confocal full-field X-ray microscope [J] . Akihisa Takeuchi, Yasuko Terada, Kentaro Uesugi, Nuclear instruments and methods in physics research . 2010,第2a3期

机译：共焦全视野X射线显微镜进行三维X射线荧光成像
4. Laser processing and monitoring of Ag photodoped patterns in GeS_2 amorphous films by dual functional laser scanning micro-processing /micro-scope system utilizing UV / VIS confocal laser scanning microscope [C] . Yoshikazu Kanai, Yoshihisa Murakami, Moriaki Wakaki, Advanced fabrication technologies for microano optics and photonics IV . 2011

机译：利用UV / VIS共聚焦激光扫描显微镜的双功能激光扫描微处理/显微镜系统对GeS_2非晶膜中的Ag光掺杂图形进行激光处理和监测
5. Confocal Microscopy Studies of Fluorescence Blinking of Semiconductor Quantum Dots, Metal Nanoparticle Photogeneration, and Multiphoton Photoemission from Thin Metal Films and Metal Nanoparticles [D] . Baker, Thomas Athanasius 2013

机译：共聚焦显微镜研究半导体量子点的荧光闪烁，金属纳米粒子的光生和金属薄膜和金属纳米粒子的多光子光发射
6. Diffusion Measurements inside Biofilms by Image-Based Fluorescence Recovery after Photobleaching (FRAP) Analysis with a Commercial Confocal Laser Scanning Microscope [O] . François Waharte, Karine Steenkeste, Romain Briandet, 2010

机译：通过商业共聚焦激光扫描显微镜进行光漂白（FRAP）分析后基于图像的荧光恢复对生物膜内部的扩散测量
7. Diffusion Measurements inside Biofilms by Image-Based Fluorescence Recovery after Photobleaching (FRAP) Analysis with a Commercial Confocal Laser Scanning Microscope ▿ [O] . Waharte, François, Steenkeste, Karine, Briandet, Romain, 2010

机译：商用共聚焦激光扫描显微镜在光漂白（FRAP）分析之后通过基于图像的荧光恢复对生物膜内部的扩散进行测量▿
8. Thin-Film Thickness Measurement Using X-Ray Peak Ratioing in the Scanning Electron Microscope [R] . Elliott, N. E., Anderson, W. E., Archuleta, T. A., 1981

机译：在扫描电子显微镜中使用X射线峰值比率测量薄膜厚度

CHARACTERIZING PROCESS SEMICONDUCTOR THIN FILMS WITH A CONFOCAL MICRO X-RAY FLUORESCENCE MICROSCOPE

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