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A Partition-Based Approach for Identifying Failing Scan Cells in Scan-BIST with Applications to System-on-Chip Fault Diagnosis

机译：基于分区的Scan-BIST中故障扫描单元的识别方法及其在片上系统故障诊断中的应用

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Chunsheng Liu; Krishnendu Chakrabarty;
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年度 2003
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1. A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST [J] . MICHAEL GOESSEL, KRISHNENDU CHAKRABARTY, VITALIJ OCHERETNIJ, Journal of Electronic Testing: Theory and Applications: Theory and Applications . 2004,第6期

机译：一种识别失败向量的签名分析技术及其在Scan-BIST中的应用
2. Design and analysis of compact dictionaries for diagnosis in scan-BIST [J] . Chunsheng Liu, Chakrabarty K. IEEE transactions on very large scale integration (VLSI) systems . 2005,第8期

机译：scan-BIST中用于诊断的紧凑型词典的设计和分析
3. Time and frequency domain scanning fault diagnosis method based on spectral negentropy and its application [J] . The International Journal of Advanced Manufacturing Technology . 2020,第4期

机译：基于光谱预期的时间和频域扫描故障诊断方法及其应用
4. A Partition-Based Approach for Identifying Failing Scan Cells in Scan-BIST with Applications to System-on-Chip Fault Diagnosis [C] . Chunsheng Liu, Krishnendu Chakrabarty, PChunsheng Liu, Workshop on New security paradigms workshop . 2009

机译：基于分区的Scan-BIST中故障扫描单元的识别方法及其在片上系统故障诊断中的应用
5. Fault diagnosis in scan-BIST with system-on-chip applications. [D] . Liu, Chunsheng. 2003

机译：使用片上系统应用程序在scan-BIST中进行故障诊断。
6. A partition-based approach to identify gene-environment interactions in genome wide association studies [O] . Ruixue Fan, Chien-Hsun Huang, Inchi Hu, 2014

机译：基于分区的方法在全基因组关联研究中识别基因与环境的相互作用
7. Identification of Error-Capturing Scan Cells in Scan-BIST With Applications to System-on-Chip [O] . Chunsheng Liu, Krishnendu Chakrabarty, Senior Member 2008

机译：利用片上系统技术识别scan-BIsT中的错误捕获扫描单元
8. Decentralized Approach for Fault Diagnosis of Three Cell Converters. [R] . Louajri, H., Sayed-Mouchaweh, M. 2014

机译：三电池变换器故障诊断的分散方法。

A Partition-Based Approach for Identifying Failing Scan Cells in Scan-BIST with Applications to System-on-Chip Fault Diagnosis

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