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The Origin and Properties of New Extended Defects Revealed by Etching in Plastically Deformed Si and SiGe

机译：通过塑性变形的Si和SiGe刻蚀揭示的新扩展缺陷的起源和性质

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Eremenko Abrosimov And;
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The Origin and Properties of New Extended Defects Revealed by Etching in Plastically Deformed Si and SiGe

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