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EBIST: A Novel Test Generator With Built-In Fault Detection Capability

机译：EBIST：具有内置故障检测功能的新型测试生成器

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Dhiraj K. Pradhan et al.;
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年度 2005
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1. EBIST: a novel test generator with built-in fault detection capability [J] . Pradhan D.K., Chunsheng Liu IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems . 2005,第9期

机译：EBIST：具有内置故障检测功能的新型测试生成器
2. Built-in Self-Test Design for Fault Detection and Fault Diagnosis in SRAM-Based FPGA [J] . Chun-Lung Hsu, Ting-Hsuan Chen Instrumentation and Measurement, IEEE Transactions on . 2009,第7期

机译：内置自检设计，用于基于SRAM的FPGA中的故障检测和故障诊断
3. Lab test of three fault detection and diagnostic methods' capability of diagnosing multiple simultaneous faults in chillers [J] . Zhao Xinzhi Energy and Buildings . 2015,第may期

机译：三种故障检测和诊断方法对冷水机组同时发生多个故障的诊断能力的实验室测试
4. EBIST: a novel test generator with built-in fault detection capability [C] . Pradhan, D.K., Chunsheng Liu, . 2003

机译：EBIST：具有内置故障检测功能的新型测试生成器
5. Transition faults and transition path delay faults: Test generation, path selection, and built-in generation of functional broadside tests. [D] . Yao, Bo. 2013

机译：过渡故障和过渡路径延迟故障：测试生成，路径选择以及功能性侧面测试的内置生成。
6. Building fault detection data to aid diagnostic algorithm creation and performance testing [O] . Jessica Granderson, Guanjing Lin, Ari Harding, 2020

机译：建立故障检测数据以帮助诊断算法创建和性能测试
7. EBIST: A Novel Test Generator with Built-In Fault Detection Capability [O] . Dhiraj Pradhan University, Dhiraj K. Pradhan 2003

机译：EBIST：具有内置故障检测功能的新型测试生成器
8. Error detection and correction unit with built-in self-test capability for spacecraft applications [R] . Timoc, Constantin 1990

机译：具有内置自检功能的错误检测和校正装置，适用于航天器应用

EBIST: A Novel Test Generator With Built-In Fault Detection Capability

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