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Measurement of Paint Layer Thickness with Photothermal Infrared Radiometry

机译：用光热红外辐射法测量漆层厚度

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P. Dörr; A. K. Louis; C. Gruss; H. Petry; Phototherm Dr; Petry Gmbh; Altenkessler Strasse;
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1. Response to "comment on 'Photothermal radiometry parametric identifiability theory for reliable and unique nondestructive coating thickness and thermophysical measurements'" [J. Appl. Phys. 122, 066101 (2017)] [J] . Guo Xinxin, Mandelis Andreas, Tolev Jordan, Journal of Applied Physics . 2017,第6期

机译：回应“对'光热辐射参数可识别性理论的评论，以实现可靠而独特的无损涂层厚度和热物理测量” [J.应用物理122，066101（2017）]
2. Comment on "photothermal radiometry parametric identifiability theory for reliable and unique nondestructive coating thickness and thermophysical measurements" [J. Appl. Phys. 121, 095101 (2017)] [J] . Krapez Jean-Claude, Rigollet Fabrice Journal of Applied Physics . 2017,第6期

机译：评论“光热辐射参数可识别性理论的可靠和独特的无损涂层厚度和热物理测量” [J。应用物理121，095101（2017）]
3. Photothermal radiometry parametric identifiability theory for reliable and unique nondestructive coating thickness and thermophysical measurements [J] . X. Guo, A. Mandelis, J. Tolev, Journal of Applied Physics . 2017,第9期

机译：光热辐射法参数可识别性理论，用于可靠且独特的无损涂层厚度和热物理测量
4. Melanoma Thickness Measurement in Two-layer Tissue Phantoms Using Pulsed Photothermal Radiometry (PPTR) [C] . Tianyi Wang, Jinze Qiu, Amit Paranjape, Optical interactions with tissue and cells XX . 2009

机译：使用脉冲光热辐射法（PPTR）测量两层组织幻影中的黑色素瘤厚度
5. Carrier-density-wave depth profilometric measurements in semiconductor silicon wafers using laser infrared photothermal radiometry. [D] . Shaughnessy, Derrick Arthur. 2002

机译：使用激光红外光热辐射法测量半导体硅晶片中的载流子密度波深度轮廓图。
6. Determination of thickness of thin turbid painted over-layers using micro-scale spatially offset Raman spectroscopy [O] . Claudia Conti, Marco Realini, Chiara Colombo, -1

机译：使用微尺度空间偏移拉曼光谱法测定薄的浑浊涂漆层的厚度
7. Comment on Photothermal radiometry parametric identifiability theory for reliable and unique nondestructive coating thickness and thermophysical measurements, J. Appl. Phys. 121(9), 095101 (2017) [O] . Krapez, Jean-Claude, Rigollet, Fabrice 2017

机译：关于光热辐射测量参数可识别性理论的评述可靠，独特的无损涂层厚度和热物理测量，J.appl。物理学。 121（9），095101（2017）
8. Measurement of Air Gap Thickness Underneath an Opaque Film by Pulsed Photothermal Radiometry [R] . Tam, A. C., Sontag, H. 1986

机译：用脉冲光热辐射法测量不透明薄膜下气隙厚度

Measurement of Paint Layer Thickness with Photothermal Infrared Radiometry

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