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New Static Compaction Techniques of Test Sequences for Sequential Circuits

机译：时序电路测试序列的新静态压缩技术

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Corno Prinetto Rebaudengo; F. Corno; P. Prinetto; M. Rebaudengo; M. Sonza Reorda;
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年度 1997
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1. Test set and fault partitioning techniques for static test sequence compaction for sequential circuits [J] . Michael S. Hsiao, Srimat Chakradhar Journal of Electronic Testing: Theory and Applications: Theory and Applications . 2000,第4期

机译：用于顺序电路的静态测试序列压缩的测试集和故障划分技术
2. Test set and fault partitioning techniques for static test sequence compaction for sequential circuits [J] . Michael S. Hsiao, Srimat Chakradhar Journal of Electronic Testing: Theory and Applications: Theory and Applications . 2000,第4期

机译：用于顺序电路的静态测试序列压缩的测试集和故障划分技术
3. Procedures for static compaction of test sequences for synchronous sequential circuits [J] . Pomeranz I., Reddy S.M. IEEE Transactions on Computers . 2000,第6期

机译：同步时序电路测试序列的静态压缩程序
4. New Static Compaction Techniques of Test Sequences for Sequential Circuits [C] . F. Corno, P. Prinetto, M. Rebaudengo, European conference on Design and Test . 1997

机译：时序电路测试序列的新静态压缩技术
5. Fast static test compaction and its application to test generation for synchronous sequential circuits. [D] . Guo, Ruifeng. 2000

机译：快速静态测试压缩及其在同步时序电路的测试生成中的应用。
6. Exome sequences versus sequential gene testing in the UK highly specialised Service for Limb Girdle Muscular Dystrophy [O] . Elizabeth Harris, Ana Topf, Rita Barresi, 2017

机译：英国高度专业的肢带肌营养不良服务中的外显子组序列与顺序基因测试
7. Partitioning and Reordering Techniques for Static Test Sequence Compaction of Sequential Circuits [O] . Michael S. Hsiao, Srimat T. Chakradhar 1998

机译：时序电路静态测序序列压缩的分区与重排序技术
8. Efficiency of Compact Testing for Sequential Circuits. [R] . Losq, J. 1976

机译：顺序电路紧凑测试的效率。

New Static Compaction Techniques of Test Sequences for Sequential Circuits

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