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A Scalable Scan-Path Test Point Insertion Technique to Enhance Delay Fault Coverage for Standard Scan Designs

机译：可扩展的扫描路径测试点插入技术，可增强标准扫描设计的延迟故障覆盖率

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Seongmoon Wang et al.;
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年度 2003
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1. A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs [J] . Seongmoon Wang, Chakradhar S.T. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems . 2006,第8期

机译：可扩展的扫描路径测试点插入技术，可增强标准扫描设计的延迟故障覆盖率
2. Reducing correlation to improve coverage of delay faults in scan-path design [J] . Weiwei Mao, Ciletti M.D. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems . 1994,第5期

机译：减少相关性以提高扫描路径设计中延迟故障的覆盖率
3. Design-for-testability to achieve complete coverage of delay faults in standard full scan circuits [J] . Irith Pomeranz, Sudhakar M. Reddy Journal of systems architecture . 2001,第3a4期

机译：可测试性设计，可完全覆盖标准全扫描电路中的延迟故障
4. A Scalable Scan-Path Test Point Insertion Technique to Enhance Delay Fault Coverage for Standard Scan Designs [C] . Seongmoon Wang, Srimat T. Chakradhar International Test Conference . 2003

机译：可扩展的扫描路径测试点插入技术，以增强标准扫描设计的延迟故障覆盖
5. New test generation methods for transition delay faults in scan designs. [D] . Zhang, Zhuo. 2006

机译：扫描设计中过渡延迟故障的新测试生成方法。
6. Comparative study of broth macrodilution and microdilution techniques for in vitro antifungal susceptibility testing of yeasts by using the National Committee for Clinical Laboratory Standards proposed standard. [O] . F Barchiesi, A L Colombo, D A McGough, 1994

机译：使用国家临床实验室标准委员会提出的标准对肉汤进行宏观稀释和微量稀释技术进行酵母菌体外抗真菌药敏试验的比较研究。
7. Hybrid Delay Scan: A Low Hardware Overhead Scan-Based Delay Test Technique for High Fault Coverage and Compact Test Sets [O] . Seongmoon Wang 2004

机译：混合延迟扫描：用于高故障覆盖和紧凑测试集的低硬件开销扫描延迟测试技术
8. Latent Failures and Coverage in Fault-Tolerant Systems. A VLSI CMOS Circuit Design Technique to Aid Test Generation [R] . Amer, H. H., McCluskey, E. J. 1986

机译：容错系统中的潜在故障和覆盖。一种用于辅助测试生成的VLsI CmOs电路设计技术

A Scalable Scan-Path Test Point Insertion Technique to Enhance Delay Fault Coverage for Standard Scan Designs

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