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Scanning X-ray spectrometer for high-resolution Compton profile measurements at ESRF

机译：扫描X射线光谱仪用于ESRF的高分辨率康普顿轮廓测量

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P. Suortti; T. Buslaps; P. Fajardo; V. Honkimäki; M. Kretzschmer; U. Lienert; J. E. McCarthy; M. Renier; A. Shukla; Th. Tschentscher; T. Meinander;
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1. Scanning X-ray spectrometer for high-resolution Compton profile measurements at ESRF [J] . P. Suortti, T. Buslaps, P. Fajardo, Journal of synchrotron radiation . 1999,第Pta2期

机译：扫描X射线光谱仪用于ESRF的高分辨率康普顿轮廓测量
2. Performance of a dispersion-compensating scanning X-ray spectrometer for Compton profile measurements [J] . Hiraoka N, Buslaps T, Honkimaki V, Journal of synchrotron radiation . 2005,第Pta5期

机译：用于Compton轮廓测量的色散补偿扫描X射线光谱仪的性能
3. A new X-ray spectrometer for high-resolution Compton profile measurements at SPring-8 [J] . Hiraoka N., Ohata T., Mizumaki M., Journal of synchrotron radiation . 2001,第Pta1期

机译：新型X射线光谱仪可在SPring-8上进行高分辨率康普顿轮廓测量
4. Measurements of Magnetic Compton Profiles of Amorphous Fe-Tb Thin Films Using Circularly Polarized X-rays [C] . C. W. Kim, Y. Tanaka, Y Sakurai, International Symposium on Designing, Processing and Properties of Advanced Engineering Materials(ISAEM 2003) pt.2; 20031105-20031108; Jeju Island; KR . 2003

机译：利用圆偏振X射线测量非晶态Fe-Tb薄膜的磁性康普顿分布
5. The development of high-resolution calorimetric x-ray detectors for Compton scattering experiments. [D] . Stahle, Caroline Kilbourne. 1992

机译：用于康普顿散射实验的高分辨率量热X射线探测器的开发。
6. Wavelength-dispersive spectrometer for X-ray microfluorescence analysis at the X-ray microscopy beamline ID21 (ESRF) [O] . J. Szlachetko, M. Cotte, J. Morse, -1

机译：波长色散光谱仪用于在X射线显微镜光束线ID21（ESRF）上进行X射线微荧光分析
7. Scanning X-ray spectrometer for high-resolution Compton profile measurements at ESRF [O] . Suortti P., Buslaps T., Meinander T., 1999

机译：扫描X射线光谱仪用于ESRF的高分辨率康普顿轮廓测量

Scanning X-ray spectrometer for high-resolution Compton profile measurements at ESRF

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