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Preparation of Cu2ZnSnS4 films by electrodeposition using ionic liquids

机译:离子液体电沉积制备Cu2ZnSnS4薄膜

摘要

We report a new technique for the growth of Cu2ZnSnS4 (CZTS) thin films. The CZTS thin films were successfully formed by electrodeposition in ionic liquid and sulfurized in elemental sulfur vapor ambient at 450 °C for 1.5 h using Argon as the carrier gas. Experimental data on X-ray diffraction indicated that the film has a kesterite structure with preferred grain orientation along (1 1 2). It is found that the energy bandgap of the film is about 1.49 eV and the optical absorption coefficient is in the order of 104 cm-1. The results are compared to a control film grown by e-beam deposition of elemental stacked layers followed by the same sulfurization process. The data show that the two films have comparable optoelectronic properties indicating that electrodeposition in ionic liquid is a viable process for the growth of CZTS films for applications in photovoltaic device. The XRD results also indicate an absence of the oxide peak in the material, which is commonly found in films grown by electrodeposition in aqueous solutions.
机译:我们报告了Cu2ZnSnS4(CZTS)薄膜生长的新技术。 CZTS薄膜是通过在离子液体中电沉积并使用氩气作为载气在450°C的单质硫蒸气环境​​中硫化1.5 h成功地形成的。 X射线衍射的实验数据表明,该膜具有沿(1 1 2)具有优选的晶粒取向的硅藻土结构。发现该膜的能带隙为约1.49eV,并且光吸收系数为约104cm-1。将结果与通过元素堆叠层的电子束沉积,然后进行相同的硫化过程而生长的控制膜进行比较。数据表明,两种膜具有可比的光电性能,表明在离子液体中进行电沉积是用于光电器件中CZTS膜生长的可行方法。 XRD结果还表明材料中不存在氧化物峰,这通常在水溶液中通过电沉积生长的薄膜中发现。

著录项

  • 作者

    Chan CP; Lam H; Surya C;

  • 作者单位
  • 年度 2010
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  • 原文格式 PDF
  • 正文语种 eng
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