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Multi-scale modeling and simulation of material removal characteristics in computer-controlled bonnet polishing

机译:计算机控制阀盖抛光中材料去除特性的多尺度建模和仿真

摘要

Computer-controlled Bonnet Polishing (CCBP) is an enabling technology which is capable of fabricating ultra-precision freeform surfaces with sub-micrometer form accuracy and surface roughness in the nanometer range, especially for difficult-to-machine and ferrous materials. However, the material removal mechanism of computer controlled bonnet polishing (CCBP) usually exhibits multidisciplinary and multi-scale complexity and hence our understanding of the material removal characteristics is still far from complete. As a result, this paper presents a multi-scale theoretical model for the prediction and simulation of the material removal characteristics in the CCBP process. The model is established based on the study of contact mechanics, kinematics theory and wear mechanisms. A series of spot polishing tests as well as simulation experiments by the theoretical model were conducted. The predicted results agree well with the experimental data. The successful development of the theoretical model helps to make the CCBP process more predictive, and so that optimizing the manufacturing process, and forms the theoretical basis for explaining some material removal mechanisms in CCUP, such as the critical polishing depth for minimizing pad scratching.
机译:计算机控制的阀盖抛光(CCBP)是一项使能技术,能够制造亚微米级的形状精度和纳米范围内的表面粗糙度的超精密自由曲面,尤其适用于难加工的含铁材料。但是,计算机控制的阀盖抛光(CCBP)的材料去除机制通常表现出多学科和多尺度的复杂性,因此,我们对材料去除特性的理解还远远不够。因此,本文提出了一种多尺度的理论模型,用于CCBP工艺中材料去除特性的预测和模拟。该模型是基于对接触力学,运动学理论和磨损机理的研究而建立的。通过理论模型进行了一系列的点抛光试验和模拟实验。预测结果与实验数据吻合良好。理论模型的成功开发有助于使CCBP工艺更具预测性,从而优化制造工艺,并为解释CCUP中的某些材料去除机理(例如使抛光垫划痕最小的关键抛光深度)奠定了理论基础。

著录项

  • 作者

    Cao ZC; Cheung CF;

  • 作者单位
  • 年度 2016
  • 总页数
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类

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