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First Principles simulations of nanoscale silicon devices with uniaxial strain

机译:具有单轴应变的纳米级硅器件的第一原理模拟

摘要

We report parameter-free first principle atomistic simulations of quantum transport in Si nanochannels under uniaxial strain. Our model is based on the density functional theory (DFT) analysis within the Keldysh nonequilibrium Green's function (NEGF) formalism. By employing a recently proposed semi-local exchange along with the coherent potential approximation we investigate the transport properties of two-terminal Si nanodevices composed of large number of atoms and atomic dopants. Simulations of the two-terminal device based on the NEGF-DFT are compared quantitatively with the traditional continuum model to establish an important accuracy benchmark. For bulk Si crystals, we calculated the effects of uniaxial strain on band edges and effective masses. For two-terminal Si nanochannels with their channel length of {sim}{10}~{m nm}, we study the effects of uniaxial strain on the electron transport. With 0.5% uniaxial tensile strain, the conductance along [110] direction is increased by {sim}{8%} and that along [001] is increased by {sim}{2%}, which are comparable with the other reported results. This paper qualitatively and quantitatively shows the current capability of first principle atomistic simulations of nanoscale semiconductor devices.
机译:我们报告了单轴应变下Si纳米通道中量子传输的无参数第一原理原子模拟。我们的模型基于Keldysh非平衡格林函数(NEGF)形式主义内的密度泛函理论(DFT)分析。通过采用最近提出的半局部交换以及相干势近似,我们研究了由大量原子和原子掺杂剂组成的两末端Si纳米器件的传输特性。将基于NEGF-DFT的两端子设备的仿真与传统连续模型进行定量比较,以建立重要的精度基准。对于块状硅晶体,我们计算了单轴应变对能带边缘和有效质量的影响。对于具有{ sim} {10}〜{ rm nm}沟道长度的两末端Si纳米沟道,我们研究了单轴应变对电子传输的影响。单轴拉伸应变为0.5%时,沿[110]方向的电导增加{ sim} {8 %},而沿[001]方向的电导增加{ sim} {2 %},与其他报告的结果。本文定性和定量地显示了纳米级半导体器件的第一原理原子模拟的当前能力。

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