首页> 外文OA文献 >Morphotropic domain structures and dielectric relaxation in piezo-/ferroelectric Pb(In1/2Nb1/2)O3-Pb(Zn1/3Nb2/3)O3-PbTiO3 single crystals
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Morphotropic domain structures and dielectric relaxation in piezo-/ferroelectric Pb(In1/2Nb1/2)O3-Pb(Zn1/3Nb2/3)O3-PbTiO3 single crystals

机译:压电/铁电Pb(In1 / 2Nb1 / 2)O3-Pb(Zn1 / 3Nb2 / 3)O3-PbTiO3单晶的向晶畴结构和介电弛豫

摘要

The domain structures, phase transitions and dielectric relaxation of relaxor-based piezo-/ferroelectric (1-x)Pb(In1/2Nb1/2)O3-0.33Pb(Zn1/3Nb2/3)O3-xPbTiO3 (x=0.30, 0.34, 0.37, and 0.42) single crystals, abbreviated as PIN-PZN-PT, grown by flux method, have been analyzed by polarized light microscope and dielectric spectroscopy. The dielectric relaxation was described by the Curie-Weiss law and Lorentz-type quadratic equation. The substitution of Ti4+ ions for the B-site complex (Zn1/3Nb2/3)4+ and (In1/2Nb1/2)4+ ions results in a long-range symmetry breaking, as revealed by the formation of birefringent domains. Single crystal of PIN-PZN-PT with morphotropic compositions exhibit complex domain structures, which are composed of both rhombohedral and tetragonal phases intimately mixed together. The domain structures, the sequence and temperature of phase transitions have been interpreted in relation to the morphotropic phase boundary behavior of the PIN-PZN-PT system. The analysis of morphotropic domain structures and phase transitions provides a better understanding of the microscopic mechanisms of the enhanced piezoelectric properties recently disclosed in the PIN-PZN-PT and other PZN-based piezocrystals.
机译:弛豫基压电/铁电(1-x)Pb(In1 / 2Nb1 / 2)O3-0.33Pb(Zn1 / 3Nb2 / 3)O3-xPbTiO3的畴结构,相变和介电弛豫(x = 0.30,0.34分别用偏振光显微镜和介电光谱法分析了通量法生长的单晶(分别为PIN-PZN-PT,0.37和0.42)。介电弛豫由居里-魏斯定律和洛伦兹型二次方程描述。用B位复合物(Zn1 / 3Nb2 / 3)4+和(In1 / 2Nb1 / 2)4+离子替代Ti4 +离子会导致长距离对称性破坏,这是由双折射域的形成所揭示的。具有同晶组成的PIN-PZN-PT单晶具有复杂的畴结构,该结构由菱形和四方相紧密混合在一起组成。相对于PIN-PZN-PT系统的相变相边界行为,已经解释了相变的畴结构,顺序和温度。同晶畴结构和相变的分析提供了对最近在PIN-PZN-PT和其他基于PZN的压电晶体中增强的压电性能的微观机理的更好理解。

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