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High-resolution phase sampled interferometry using symmetrical number systems

机译：使用对称数字系统的高分辨率相位采样干涉仪

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IEEE AP-S, Vol. 49, No. 10, Oct. 2001, pp. 1411-1423

机译：IEEE AP-S，第一卷49，第10号，2001年10月，第1411-1423页

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Pace Phillip E.; Jenn David C.;
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1. High-resolution phase sampled interferometry using symmetricalnumber systems [J] . Pace P.E., Wickersham D., Jenn D.C., IEEE Transactions on Antennas and Propagation . 2001,第10期

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2. A method is proposed for checking the reliability of a quantitative estimate of longitudinal displacements in metallic beam samples when they are investigated by electronic speckle interferometry and phase-shifting speckle interferometry. Theoretical [J] . R. V. Skidanov, S. N. Khonina Journal of optical technology . 2004,第7期

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3. Frequency domain phase extraction algorithm for phase-shifting interferometry with random phase-shifting amount and low-sampling rate [J] . Shengde Liu, Liyun Zhong, Fengjie Zhang, Optics Communications: A Journal Devoted to the Rapid Publication of Short Contributions in the Field of Optics and Interaction of Light with Matter . 2013,第Null期

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4. Symmetrical number system phase sampled DF antenna architectures [C] . Jenn, D.C., Pace, . 1998

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7. Design of a phase sampled interferometry antenna using the robust symmetrical number system [O] . York Nathan S. 2000

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High-resolution phase sampled interferometry using symmetrical number systems

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