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New general formulation and experimental verification of harmonic clipping contours in high frequency power devices

机译:高频功率器件谐波削波轮廓的新通用公式和实验验证

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摘要

This paper presents a novel closed form solutionudfor the theoretical calculation of harmonic clipping contoursudwhen an arbitrary number of harmonics is considered. Theudclipping contours can be used to design the loads of a highudfrequency power device in order to avoid drain current clipping,udhence preventing strong non-linear effects. For the first time theudpredicted second harmonic contours are validated thoroughly byudmeans of experimental characterization of GaN HEMT devices.udThe measured contours result in good agreement with the theory.udMoreover, the effect of third harmonic load tuning is alsoudassessed, and verified for the first time. These results prove thatudthe clipping contours can be used as a tool for the systematicuddesign of low distortion power amplifiers.
机译:本文提出了一种新颖的闭合形式解 ud,用于谐波削波轮廓的理论计算 ud,其中考虑了任意数量的谐波。削峰轮廓可用于设计高频功率设备的负载,以避免漏极电流削峰,从而避免了强烈的非线性影响。首次通过氮化镓HEMT器件的实验表征手段彻底验证了预测的二次谐波轮廓。 ud测得的轮廓与理论相符。 ud此外,还评估了三次谐波负载调谐的效果。 ,并且是首次验证。这些结果证明,削波轮廓可以用作低失真功率放大器系统设计的工具。

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