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In situ monitoring of the surface reconstructions on InP(001) prepared by molecular beam epitaxy

机译:分子束外延制备的InP(001)表面重建的原位监测

摘要

Reflection anisotropy spectroscopy (RAS) and reflection high-energy electron diffraction (RHEED) were applied to study clean InP(001) surfaces prepared by molecular beam epitaxy (MBE). At phosphorus beam equivalent pressures (BEPs) between 3.5×10−7 and 3.5×10−6 mbar and substrate temperature (Ts) falling from 590 to 150 °C, (2×4), (2×1), (2×2), and c(4×4) RHEED patterns are observed. The main RAS features, observed at 1.7–1.9 and 2.6–2.9 eV are assigned to In and P dimers, respectively. The above reconstruction sequence is associated closely with transformations identified in RAS signatures that are induced by progressively increasing the P surface coverage. The RAS results also imply the existence of (2×4)α and (2×4)β phases. A surface-phase diagram for MBE-grown (001) InP, in the whole range of Ts and phosphorus BEPs is proposed.
机译:反射各向异性光谱(RAS)和反射高能电子衍射(RHEED)用于研究分子束外延(MBE)制备的干净InP(001)表面。在磷束等效压力(BEPs)在3.5×10-7和3.5×10-6 mbar之间且基板温度(Ts)从590降至150 C时,(2×4),(2×1),(2× 2),并观察到c(4×4)RHEED模式。在1.7–1.9 eV和2.6–2.9 eV处观察到的主要RAS功能分别分配给In和P二聚体。上面的重建序列与在RAS签名中标识的转换密切相关,该转换是通过逐渐增加P表面覆盖率来诱导的。 RAS结果还暗示了(2×4)α和(2×4)β相的存在。提出了在整个Ts和磷BEPs范围内MBE生长的(001)InP的表面相图。

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