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Physical layout design and analysis of charge recycling SRAM system with write-assist feature in 90nm CMOS technology

机译:具有90nm CMOS技术的写辅助功能的电荷回收SRAM系统的物理布局设计和分析

摘要

Transistor leakage power will account for more than 50% of total chip power as process technology advances into submicron regime. To counter increasing subthreshold leakage current in traditional SRAM, a new 6T single-ended input/output WA-SRAM is analyzed. WA-SRAM employs a charge-recycling technique to reduce static power of large size SRAM. This thesis describes the physical layout implementation of a 2KByte WA-SRAM system in 90nm CMOS technology and the analysis of the effectiveness of a charge recycling technique. The WA-SRAM exhibits 75% less leakage power per bit than standard SRAM cells in standby mode. Most dynamic operations of WA-SRAM exhibit less active power consumption than standard SRAM with a few exceptions. The exceptions are highly dependent on the type of operation of the previous cycle. The WA-SRAM has shown the potential of supplying the recycled charges to other circuits as a power source when cache size exceeds 9Kbytes.
机译:随着工艺技术发展到亚微米级,晶体管泄漏功率将占芯片总功率的50%以上。为了应对传统SRAM中亚阈值泄漏电流的增加,分析了一种新型6T单端输入/输出WA-SRAM。 WA-SRAM采用电荷循环技术来减少大型SRAM的静态功耗。本文介绍了90nm CMOS技术中2KByte WA-SRAM系统的物理布局实现,并分析了电荷回收技术的有效性。在待机模式下,WA-SRAM的每位泄漏功率比标准SRAM单元低75%。除少数例外,WA-SRAM的大多数动态操作都比标准SRAM的有源功耗要低。例外情况在很大程度上取决于上一个周期的操作类型。当高速缓存大小超过9 KB时,WA-SRAM已显示出有潜力将回收的电荷提供给其他电路作为电源。

著录项

  • 作者

    Wang Szu-Mien;

  • 作者单位
  • 年度 2007
  • 总页数
  • 原文格式 PDF
  • 正文语种 English
  • 中图分类

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